Skip to main content

Focused Ion Beams and their Applications in Microfabrication

  • Chapter
  • 135 Accesses

Part of the book series: NATO ASI Series ((NSSE,volume 235))

Abstract

Focused ion beams present a unique tool for microfabrication by micromachining and deposition. Liquid metal ion sources provide a low emittance quasi point source capable of being focused to spots of a few tens of nanometres using electric lenses. Preliminary models for machining and deposition processes have been developed but more work is required. The technology is already being applied in a number of important applications including mask and reticle repair and “chip surgery”.

This is a preview of subscription content, log in via an institution.

Buying options

Chapter
USD   29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD   39.99
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD   54.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Learn about institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. Lawes, R. A., Appl.Surface Sci. 36 (1989) 485

    Article  ADS  Google Scholar 

  2. Drummond, I. V. and Long, J. V. P., Int. Conf. Ion Sources (1969) 459, INST Saclay, Paris, France

    Google Scholar 

  3. Prewett, P. D., Mair, G. L. R. and Thompson, S.P., J.Phys. D 15 (1982) 1339

    Article  ADS  Google Scholar 

  4. Taylor, G. I., Proc. R.Soc. A280 (1964) 383

    ADS  Google Scholar 

  5. Mair, G. L. R., J.Phys. D 17 (1984) 2323

    Article  ADS  Google Scholar 

  6. Kingham, D. R. and Swanson, L. W. Appl.Phys. A34 (1984) 123

    ADS  Google Scholar 

  7. Kingham, D. R. and Swanson, L. W. Appl.Phys. A41 (1986) 157

    ADS  Google Scholar 

  8. Alton, G. D. and Read, P. M.J.Phys. D. 22 (1989) 1029

    Article  ADS  Google Scholar 

  9. Alton, G. D. and Read, P. M. J.Appl.Phys. 66 (1989) 1020

    Article  ADS  Google Scholar 

  10. Knauer, W. Optik 54 (1979) 211

    Google Scholar 

  11. Knauer, W. Optik 59 (1981) 335

    Google Scholar 

  12. Prewett, P. D. and Mair, G. L. R., “Focused Ion Beams from Liquid Metal Ion Sources” Ch.III p.112.Research Studies Press, Taunton, 1991

    Google Scholar 

  13. MicroTrim TM, Oxford Plasma Technology Ltd., Yatton, Bristol U.K.

    Google Scholar 

  14. Kubena, R. L., Stratton, F. P., Ward, J. W., Atkinson, G. M. and Joyce, R. J. J.Vac.Sci.Technol. B7 (1989) 1798

    Google Scholar 

  15. Ward, J. W., Kubena, R. L. and Utlaut, M. W. J.Vac.Sci.Technol. B6 (1988) 2090

    Google Scholar 

  16. Cleaver, J.R.A., Heard,P.J. and Ahmed, H. Microcircuit Engineering 83 eds. H. Ahmed, J R A Cleaver and G A C Jones (1983) 135, Academic Press, London

    Google Scholar 

  17. Ochiai, Y. Gamo, K. and Namba, S. Jpn. J.Appl.Phys. 23 (1984) L400

    Article  ADS  Google Scholar 

  18. Ochiai, Y. Gamo, K. and Namba, S. J.Vac.Sci.Technol. B3 (1985) 67

    Google Scholar 

  19. Ochiai, Y., Shihoyama, K., Masuyama, A., Gamo, K.,Shiokawa, T., Toyoda, K. and Namba, S. Jpn. J.Appl.Phys.24 (1985) L169

    Article  ADS  Google Scholar 

  20. Ochiai, Y., Shihoyama, K., Toyoda, K., Masuyama, A., Gamo, K. and Namba, S., Jpn.J.Appl.Phys. 25 (1986) L526

    Article  ADS  Google Scholar 

  21. Heard, P. J., Prewett, P. D. and Lawes, R. A. Microelectronic Eng. 6 (1987) 597

    Article  Google Scholar 

  22. Shedd, G. M., Lezec, H., Dubner, A. D. and Meingailis, J. Appl.Phys.Lett. 49 (1986) 1584

    Article  ADS  Google Scholar 

  23. Vasile, M. J. and Harriott, L. R., J.Vac.Sci.Technol. B7 (1988) 1954

    Google Scholar 

  24. Heard, P. J. and Prewett, P. D., Microelectronic Eng. 11 (1990) 421

    Article  Google Scholar 

  25. Prewett, P. D. and Heard, P. J., J. Phys D. 20 (1987) 1207

    Article  ADS  Google Scholar 

  26. Prewett, P. D., Gentili, M., Maggiora, R., Mastriogiacomo, L., Watson, J. G., Turner, G. S., Brown, G. W., Plumb, D., Leonard, Q. and Cerrina, F., Microelectronic Eng. 17 (1992) 249

    Article  Google Scholar 

  27. Prewett, P. D., McGeary, M. L., Watson, J. G., Brown, G. W., Turner, G. S., Loader, I. M. and Heard, P. J. Microelectronic Eng 17 (1992) 423

    Article  Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 1993 Springer Science+Business Media Dordrecht

About this chapter

Cite this chapter

Prewett, P.D. (1993). Focused Ion Beams and their Applications in Microfabrication. In: Binh, V.T., Garcia, N., Dransfeld, K. (eds) Nanosources and Manipulation of Atoms Under High Fields and Temperatures: Applications. NATO ASI Series, vol 235. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-1729-6_12

Download citation

  • DOI: https://doi.org/10.1007/978-94-011-1729-6_12

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-94-010-4758-6

  • Online ISBN: 978-94-011-1729-6

  • eBook Packages: Springer Book Archive

Publish with us

Policies and ethics