Abstract
AFM and LFM images were obtained for the first time on the layered dichalcogenide rhenium disulfide (ReS2. ReS2 is of special interest for the investigation of the AFM/LFM imaging process, as the rhenium and the sulphur sublattices have different structures and as the surface consists of alternating rows of sulphur atoms with different height. The AFM/LFM images show typical signs of atomic scale friction like scan hystereses and saw-tooth profiles. In most cases, a dominating stick and slip behaviour of the cantilever tip is observed, leading only to elementary cell resolution instead of atom-by-atom resolution in both the AFM and the LFM images. However, if the atomic-scale stick and slip processes are suppressed by applying a z-modulation technique, atom-by-atom resolution is obtained. The the lattice constants being in good agreement with the x-ray data.
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References
R. Wiesendanger and D. Anselmetti, “STM on Layered Materials” in: H.-J. Güntherodt and R. Wiesendanger (eds.): “Scanning Tunneling Microscopy I”, Springer Series in Surface Sciences 20, Berlin, 1992
E. Meyer and H. Heinzelmann, “Scanning Force Microscopy” in: R. Wiesendanger and H.-J. Güntherodt (eds.): “Scanning Tunneling Microscopy II”, Springer Series in Surface Sciences 28, Berlin, 1992
M. Ch. Lux-Steiner, “Synthesis, Optoelectronic Properties and Applications of New Semiconductor Crystals”, Springer Verlag, Heidelberg, 1991
K. Friemelt, M. Ch. Lux-Steiner and E. Bucher, J. Appl. Phys. 74(8) (1993) 5266
K. Friemelt, M. Ch. Lux-Steiner and E. Bucher, Proceedings of the 11th European Photovoltaic Solar Energy Conference, 1992, in press
K. Friemelt, S. Akari, M. Ch. Lux-Steiner, T. Schill, E. Bucher and K. Dransfeld, Annalen der Physik 1 (1992) 248
S. Akari, K. Friemelt, K. Glöckler, M.Ch. Lux-Steiner, E. Bucher and K. Dransfeld, Appl. Phys. A 57 (1993) 221
S. Buchholz, H. Fuchs and J.P. Rabe, Adv. Mater. 3 (1991) 51
H. Fuchs, R. Laschinski and Th. Schimmel, Europhys. Lett. 13(4) (1990) 307
Th. Schimmel, H. Fuchs, S. Akari and K. Dransfeld, Appl. Phys. Lett. 58 (1991) 1039
H. Fuchs and Th. Schimmel, Adv. Mater. 3 (1991) 112
Th. Schimmel, R. Kemnitzer, J. Küppers, Ch. Kloc und M. Lux-Steiner, this volume
N. W. Alcock and A. Kjekshus, Acta Chem. Scand. 19 (1965) 79
J.C. Wildervanck and F. Jellinek, J. Less-Common Metals 24 (1971) 73
R. Späh, Ph.D. Thesis, Konstanzer Dissertationen, Vol. 130, Hartung-Gorre Verlag, Konstanz, 1986
Th. Schimmel, B. Winzer, R. Kemnitzer, Th. Koch, J. Küppers and M. Schwoerer, Adv. Mater., 1994, in press.
C.M. Mate, G.M. McClelland, R. Erlandsson and S. Chiang, Phys. Rev. Lett. 59(17) (1987) 1942
Th. Schimmel, K. Friemelt, J. Küppers and M. Lux-Steiner, in prep.
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Schimmel, T., Friemelt, K., Küppers, J., Lux-Steiner, M. (1995). Atomic Resolution Imaging of ReS2 by AFM/LFM. In: Güntherodt, H.J., Anselmetti, D., Meyer, E. (eds) Forces in Scanning Probe Methods. NATO ASI Series, vol 286. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-0049-6_49
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DOI: https://doi.org/10.1007/978-94-011-0049-6_49
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