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Forces in Scanning Probe Methods pp 405–424Cite as

Mechanical Property Evaluations of Solid Surfaces as a Technological Application of SPM

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Part of the book series: NATO ASI Series ((NSSE,volume 286))

Abstract

Scanning force microscopes can be used to evaluate mechanical properties of solid surfaces. This is important in developing the very small and lightweight mechanical devices now beginning to be used. A very sharp diamond tip is used for microhardness and microwear tests. Adsorbed layer distributions and frictional force distributions on solid surfaces are also measured. These techniques and examples of the evaluations are introduced.

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Author information

Authors and Affiliations

  1. NTT Kaneko Laboratory, Midori-cho, Musashino-shi, Tokyo, 180, Japan

    R. Kaneko, M. Igarashi & T. Miyamoto

  2. Operation Headquarters 1, Taiyo Yuden Co. Ltd, Yawatabara-machi, Takasaki-shi, Gunma, 370, Japan

    E. Hamada

Authors
  1. R. Kaneko
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  2. M. Igarashi
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  3. T. Miyamoto
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  4. E. Hamada
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Editor information

Editors and Affiliations

  1. Institute of Physics, University of Basel, Basel, Switzerland

    H. J. Güntherodt  & E. Meyer  & 

  2. Ciba Geigy Ltd., Central Research Services Physics, K-127.1.50, Basel, Switzerland

    D. Anselmetti

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© 1995 Springer Science+Business Media Dordrecht

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Kaneko, R., Igarashi, M., Miyamoto, T., Hamada, E. (1995). Mechanical Property Evaluations of Solid Surfaces as a Technological Application of SPM. In: Güntherodt, H.J., Anselmetti, D., Meyer, E. (eds) Forces in Scanning Probe Methods. NATO ASI Series, vol 286. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-0049-6_36

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  • DOI: https://doi.org/10.1007/978-94-011-0049-6_36

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-94-010-4027-3

  • Online ISBN: 978-94-011-0049-6

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