Screening Analysis of Soil, Water and Waste with X-Ray Fluorescence Using Matrix Independent Calibration Techniques

  • R. Schramm


The need of screening tools for on site field analysis leads to an increasing interest for the use of x-ray fluorescence (XRF) analysis. Different studies performed in 2000 show a systematic comparison between the different instrument techniques available in the market. Beside the design of the instruments concerning excitation source, sample presentation and detection system also the use of the calibration strategy is important.


Compton Scattering Screen Analysis Matrix Correction Mass Absorption Coefficient Loose Powder 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.


Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.


  1. (1).
    U. Saring, Evaluation of Selected On-Site-Analysis Methods, presented on Field Screening Europe 2001, May 2001.Google Scholar
  2. (2).
    C. Vanhoof, V. Corthouts, K. Tirez, EDXRF as Field Analytical Technique: Comparison of Various Systems Based on a Case Study, presented on Field Screening Europe 2001, May 2001.Google Scholar
  3. (3).
    J. Heckel, M. Haschke, M. Brumme, R. Schindler, Principles and Applications of Energy-dispersive X-ray Fluorescence Analysis With Polarized Radiation, J. Anal. Atom. Spectrom. 7, 281 (1992).CrossRefGoogle Scholar
  4. (4).
    J. Heckel; M. Brumme; A. Weinert and K. Irmer, Multi-Element Trace Analysis of Rocks and Soils by EDXRF Using Polarized Radiation, X-ray Spectrom. , 20 (1991) 287.CrossRefGoogle Scholar
  5. (5).
    J. Heckel, Using Barkla polarized X-ray radiation in energy dispersive X-Ray fluorescence analysis (EDXRF), J. Trace Microprobe Tech. , 13(2) (1995) 97.Google Scholar
  6. (6).
    J. H. Hubbell, W. J. Veigele, E. A. Briggs, R. T. Brown, D. T. Cromer, R. J. Howerton, Atomic Form Factors, Incoherent Scattering Functions, and Photon Scattering Cross Sections, J. Phys. Chem. Ref. Data,Vol. 4, No. 3 (1975).CrossRefGoogle Scholar
  7. (7).
    G. Andermann and J. W. Kemp, Scattered X-Rays as Internal Standard in X-Ray Emission Spectroscopy, Anal. Chem. 30, 1306 (1958).CrossRefGoogle Scholar
  8. (8).
    R. C. Reynolds, Matrix Corrections In Trace Element Analysis by X-Ray Fluorescence: Estimation of the Mass Absorption Coefficient by Compton Scattering, J. Am. Mineral. 48, 1133 (1963).Google Scholar
  9. (9).
    C. E. Feather and J. P. Willis, A Simple Method for Background and Matrix Correction of Spectral Peaks in Trace Element Determination by X-Ray Fluorescence Spectrometry, X-Ray Spectrom. 5, 41 (1976).CrossRefGoogle Scholar

Copyright information

© Springer Science+Business Media Dordrecht 2002

Authors and Affiliations

  • R. Schramm
    • 1
  1. 1.Spectro Analytical InstrumentsKleveGermany

Personalised recommendations