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Near-Field Microwave Microscopy of Materials Properties

  • Chapter
Microwave Superconductivity

Part of the book series: NATO Science Series ((NSSE,volume 375))

Abstract

Near-field microwave microscopy has created the opportunity for a new class of electrodynamics experiments of materials. Freed from the constraints of traditional microwave optics, experiments can be carried out at high spatial resolution over a broad frequency range. In addition, the measurements can be done quantitatively so that images of microwave materials properties can be created. We review the five major types of near-field microwave microscopes and discuss our own form of microscopy in detail. Quantitative images of microwave sheet resistance, dielectric constant, and dielectric tunability are presented and discussed. Future prospects for near-field measurements of microwave electrodynamic properties are also presented.

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  1. Center for Superconductivity Research, and Materials Research and Engineering Center, Department of Physics, University of Maryland, College Park, Maryland, 20742-4111, USA

    Steven M. Anlage, D. E. Steinhauer, B. J. Feenstra, C. P. Vlahacos & F. C. Wellstood

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  1. Steven M. Anlage
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  2. D. E. Steinhauer
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  3. B. J. Feenstra
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  4. C. P. Vlahacos
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  5. F. C. Wellstood
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Editors and Affiliations

  1. Air Force Office of Scientific Research, Arlington, VA, USA

    Harold Weinstock

  2. M. Nisenoff Associates, Kensington, MD, USA

    Martin Nisenoff

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© 2001 Springer Science+Business Media Dordrecht

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Anlage, S.M., Steinhauer, D.E., Feenstra, B.J., Vlahacos, C.P., Wellstood, F.C. (2001). Near-Field Microwave Microscopy of Materials Properties. In: Weinstock, H., Nisenoff, M. (eds) Microwave Superconductivity. NATO Science Series, vol 375. Springer, Dordrecht. https://doi.org/10.1007/978-94-010-0450-3_10

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  • DOI: https://doi.org/10.1007/978-94-010-0450-3_10

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-1-4020-0446-9

  • Online ISBN: 978-94-010-0450-3

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