Abstract
Synchrotron Mössbauer Reflectometry (SMR), the grazing incidence nuclear resonant scattering of synchrotron radiation, can be applied to perform depth-selective phase analysis and to determine the isotopic and magnetic structure of thin films and multilayers. Principles and methodological aspects of SMR are briefly reviewed. Off-specular SMR provides information from the lateral structure of multilayers. In anti-ferromagneticly coupled systems the size of magnetic domains can be measured.
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Deák, L. et al. (2003). Recent Developments in Synchrotron Mössbauer Reflectometry. In: Gütlich, P., Fitzsimmons, B.W., Rüffer, R., Spiering, H. (eds) Mössbauer Spectroscopy. Springer, Dordrecht. https://doi.org/10.1007/978-94-010-0045-1_4
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DOI: https://doi.org/10.1007/978-94-010-0045-1_4
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