Abstract
The modern analytical electron microscope such as the “dedicated” STEM offers extended analytical facilities at the nanometer level. After a brief description of this new Kind of machine, the different analytical modes presently developed are presented and compared. The most common techniques are then examined when applied to heterogeneous catalysts — especially oxides, sulfides or other compounds — and more generally to highly divided solids. Endly, the future of analytical electron microscopy is discussed.
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© 1983 D. Reidel Publishing Company
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Freund, E., Dexpert, H. (1983). Analytical Electron Microscopy. In: Bonnelle, J.P., Delmon, B., Derouane, E. (eds) Surface Properties and Catalysis by Non-Metals. NATO ASI Series, vol 105. Springer, Dordrecht. https://doi.org/10.1007/978-94-009-7160-8_8
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DOI: https://doi.org/10.1007/978-94-009-7160-8_8
Publisher Name: Springer, Dordrecht
Print ISBN: 978-94-009-7162-2
Online ISBN: 978-94-009-7160-8
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