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Analytical Electron Microscopy

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Part of the book series: NATO ASI Series ((ASIC,volume 105))

Abstract

The modern analytical electron microscope such as the “dedicated” STEM offers extended analytical facilities at the nanometer level. After a brief description of this new Kind of machine, the different analytical modes presently developed are presented and compared. The most common techniques are then examined when applied to heterogeneous catalysts — especially oxides, sulfides or other compounds — and more generally to highly divided solids. Endly, the future of analytical electron microscopy is discussed.

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© 1983 D. Reidel Publishing Company

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Freund, E., Dexpert, H. (1983). Analytical Electron Microscopy. In: Bonnelle, J.P., Delmon, B., Derouane, E. (eds) Surface Properties and Catalysis by Non-Metals. NATO ASI Series, vol 105. Springer, Dordrecht. https://doi.org/10.1007/978-94-009-7160-8_8

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  • DOI: https://doi.org/10.1007/978-94-009-7160-8_8

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-94-009-7162-2

  • Online ISBN: 978-94-009-7160-8

  • eBook Packages: Springer Book Archive

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