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The Use of High Resolution Electron Microscopy in the Study of Modulated Structures in Alloy Systems

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Book cover Modulated Structure Materials

Part of the book series: Nato ASI Series ((NSSE,volume 83))

Abstract

Electron microscopy and electron diffraction have become powerful tools in studying long period antiphase boundary structures in alloy systems; they can provide information about a very small volume of material,in direct space as well as in reciprocal space. In particular if the basic structure is known a detailed structure determination can be made using geometrical features of the diffraction pattern, complemented by high resolution images.

Evidence is presented to support the idea that in a number of systems the formation of such structures is composition driven, at least in part.

Some conclusions are presented as to the building principle of such periodic antiphase boundary structures.

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References

  1. Van Tendeloo, G. and S. Amelinckx, Acta Cryst. A30, 431 (1974).

    Google Scholar 

  2. Wondraschek, H. and W. Jeitschko, Acta Cryst. A32, 664 (1976).

    Google Scholar 

  3. Barnighausen, H., Comm. Math. Chem. 9, 139 (1980).

    Google Scholar 

  4. Portier, R. and D. Gratias, J. de Physique 43, C4–17 (1982).

    Google Scholar 

  5. Amelinckx, S., AIP Conference Proceedings nr. 53, p. 102 (1979).

    Article  CAS  Google Scholar 

  6. Van Tendeloo, G., Van Landuyt, J., and S. Amelinckx, Phys. stat. sol. (a) 33, 723 (1976).-Liebau, F. and H. Bohm, Acta Cryst. A38, 252 (1982).

    Article  Google Scholar 

  7. Van Landuyt, J., Wiegers, G.A. and S. Amelinckx, Phys. stat. sol. (a) 46, 479 (1978).

    Article  Google Scholar 

  8. Van Landuyt, J., Van Tendeloo, G. and S. Amelinckx, Phys. stat. sol. (a) 26, 359 (1974).-Van Landuyt, J., Van Tendeloo, G. and S. Amelinckx, Phys. stat. sol. (a) 26, 585 (1974).-Van Landuyt, J., Van Tendeloo, G. and S. Amelinckx, Phys. stat. sol. (a) 36, 767 (1976).-Van Landuyt, J., Van Tendeloo, G. and S. Amelinckx, Phys. stat. sol. (a) 42, 565 (1977).

    Article  Google Scholar 

  9. Wilson, J.A., di Salvo, F.J. and S. Mahajan, Adv. Phys. 24, 117 (1975).-Williams, P.M., Parry, G.S. and C.B. Scruby, Phil. Mag. 29, 695 (1974).

    Article  CAS  Google Scholar 

  10. Iizumi, M., Axe, J.D., Shirane, G. and K. Shimaoka, Phys. Rev. B15, 4392 (1977).

    Google Scholar 

  11. Tanaka, M., Saito, R. and K. Tsuzuki, Jap. J. Appl. Phys. 21, 291 (1982).-Yamamoto, N., Acta Cryst. A38 (1982).-Hutchison, J.L., Chem. Scripta 14, 181 (1979).-Smith, D.J. and J.L. Hutchison, J. Microscopy 129, 285 (1983)

    Article  CAS  Google Scholar 

  12. De Ridder, R., Van Tendeloo, G. and S. Amelinckx, Phys. stat. sol. (a) 33, 383 (1976).-Nowotny H. in: The Chemistry of Extended Defects in Non-Metallic Solids, Ed. L. Eyring and M.O.’Keeffe, North Holland Publishing Co., Amsterdam, 1970, p.223.

    Article  Google Scholar 

  13. Van Tendeloo, G., Den Broeder, F.J.A., Amelinckx, S., De Ridder, R., Van Landuyt, J. and H.J. van Daal, Phys. stat. sol. (a) 67, 217 (1981).-Den Broeder, F.J.A., Van Tendeloo, G., Amelinckx, S., Hornstra, J., De Ridder, R., Van Landuyt, J. and H.J. van Daal, Phys. stat. sol. (a) 67, 233 (1981).

    Article  Google Scholar 

  14. Van Tendeloo, G. and S. Amelinckx, Phys. stat. sol. (a) 22, 621 (1974).-Van Tendeloo, G. and S. Amelinckx, Phys. stat. sol. (a) 27, 93 (1975).

    Article  Google Scholar 

  15. Van Tendeloo, G., Wolf, R., Van Landuyt, J. and S. Amelinckx, Phys. stat. sol. 47, 539 (1978).-Wolf, R., Van Tendeloo, G., Van Landuyt, J. and S. Amelinckx, Phys. stat. sol. (a) 49, 337 (1978).-Van Tendeloo, G. and S. Amelinckx, Phys. stat. sol.(a) 65, 73 (1981).-Van Tendeloo, G. and S. Amelinckx, Phys. stat. sol.(a) 65, 431 (1981).-Van Tendeloo, G., Van Landuyt,J. and S. Amelinckx, Phys. stat. sol. (a), 70, 145 (1982).-Van Landuyt, J., Van Tendeloo, G. and S. Amelinckx, Phys. stat. sol. (a), 70, 407 (1982).-Van Tendeloo, G. and S. Amelinckx, Phys. stat. sol. (a) 71, 185 (1982).

    Article  Google Scholar 

  16. Van Tendeloo, G., Van Sande, M., Amelinckx, S. and P. Airo, Electron Microscopy 1980, volume 1, p.276.-Van Tendeloo, G. and S. Amelinckx, Phys. stat. sol. (a) 69, 103 (1982).

    Google Scholar 

  17. Van Tendeloo, G. and S. Amelinckx, Phys. stat. sol. (a) 43, 553 (1977).-Van Tendeloo, G. and S. Amelinckx, Phys. stat. sol. (a)50, 53 (1978).-Schryvers, D., Van Tendeloo, G., Van Landuyt, J. and S.Amelinckx Phys. stat. sol. (a) 75, 607 (1983).

    Article  Google Scholar 

  18. Schryvers, D., Van Landuyt, J., Van Tendeloo, G. and S. Amelinckx, Phys. stat. sol. (a) 76, 575 (1983).

    Article  CAS  Google Scholar 

  19. Van Dyck, D., Van Landuyt, J., Amelinckx, S., Nguyen Hiu-Dung and C. Dagron, Journal of Solid State Chemistry 19, 179 (1976).

    Article  Google Scholar 

  20. Colaitis, D., Van Dyck, D. and S. Amelinckx, Phys. stat. sol. (a) 68, 419 (1981).

    Article  CAS  Google Scholar 

  21. Van Tendeloo, G., Gregoriades, P. and S. Amelinckx, submitted to J. Sol. St. Chem.

    Google Scholar 

  22. Meulemans, M., Delavignette, P., Garcia-Gonzales, F. and S. Amelinckx, Mat. Res. Bull. 5, 1025 (1970).-Snykers, M., Serneels, R., Delavignette, P., Gevers, R. and S. Amelinckx, Crystal Lattice Defects 3, 99 (1972).-Snykers, M., Delavignette, P. and S. Amelinckx, Phys. stat. sol. (a) 48, K1 (1971).

    Article  CAS  Google Scholar 

  23. Van Sande, M., Van Landuyt, J. and S. Amelinckx, Phys. stat. sol. (a) 55, 41 (1979).-Morton, A.J., Acta Met. 27, 863 (1979).

    Article  Google Scholar 

  24. Van Landuyt, J. and S. Amelinckx, Mat. Res. Bull. vol. 6, 613 (1971).-Dubey, M., Singh, G. and G. Van Tendeloo, Acta Cryst. A33, 276 (1977).-Gai, P.L., Anderson, J.S. and C.N.R. Rao, J. Phys. D8, 1157 (1975).-Jepps, R.W.. and T.F. Page, J. of Microscopy 116, 159 (1979).

    Article  Google Scholar 

  25. Akizuki, M., Am. Mineralogist, 66, 1006 (1981).

    CAS  Google Scholar 

  26. Van Tendeloo, G., Van Landuyt, J. and S. Amelinckx, “40th Ann. Proc. EM Soc. Amer.”, Washington D.C., 1982, G. W. Bailey (ed.) p. 540.-Van Tendeloo, G., Wolf, R., Van Landuyt, J. and S. Amelinckx, Phys. stat. sol. (a) 60, 581 (1980).

    Google Scholar 

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© 1984 Martinus Nijhoff Publishers, Dordrecht

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Amelinckx, S., Van Landuyt, J., Van Tendeloo, G. (1984). The Use of High Resolution Electron Microscopy in the Study of Modulated Structures in Alloy Systems. In: Tsakalakos, T. (eds) Modulated Structure Materials. Nato ASI Series, vol 83. Springer, Dordrecht. https://doi.org/10.1007/978-94-009-6195-1_12

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  • DOI: https://doi.org/10.1007/978-94-009-6195-1_12

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-94-009-6197-5

  • Online ISBN: 978-94-009-6195-1

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