Abstract
Qualitative interpretation of X-ray data simply requires that the energy (or wavelength) of the observed peaks be compared with the energies of the characteristic peaks of the elements. The quantitative interpretation of X-ray data from thin samples differs from the interpretation of similar data from thick samples in several ways. The whole of the following discussion of the interpretation of X-ray data will be based on the assumption that the data have been obtained from a thin film using an EDX rather than a WDX system. Clearly the underlying principles are identical to those for the interpretation of bulk analysis using EDX or WDX detectors. The interpretation of data from bulk samples is more involved and the major differences between thin foil and bulk analysis are discussed in Section 6.3 and have also been covered in Chapter 2.
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References
Cliff, G. and Lorimer, G.W. (1975) J. Microscopy, 103, 203.
Duncumb, P. (1968) J. de Microscope, 7, 581.
Philibert, J. and Tixier, R. (1968) Br. J. Appl. Phys., 1, 685.
Goldstein, J.I., Costley, J.L., Lorimer, G.W. and Reed, S.J.B. (1977) Scanning Electron Microsc., 315.
Bracewell, B.L. and Veigle, W.J. (1971) in Developments in Applied Spectroscopy, Vol. 9, (ed. A. Perkins), Plenum Press, New York.
Nockolds, C., Nasir, M.J., Cliff, G. and Lorimer, G.W. (1980) in Electron Microscopy and Analysis 1979:Inst. Phys. Conf. Ser. No. 52, (ed. T. Mulvey), Adam Hilger, Bristol, p. 417.
Nicholls, A.W. and Jones, I.P. (1982) J. Microscopy, 127, 119.
Lorimer, G.W., Al-Salman, S.A. and Cliff, G. (1977) in Developments in Electron Microscopy and Analysis 1977: Inst. Phys. Conf. Ser. No. 36, (ed. D.L. Misell), Adam Hilger, Bristol, p. 369.
Hall, C.R. (1966) Proc. R. Soc. A, 295, 140.
Castaing, J. and Descamps, J. (1955) J. Phys. Rad., 16, 304.
Reed, S.J.B. (1975) Electron Probe Microanalysis, Cambridge University Press, Cambridge.
Brown, L.M. (1981) J.Phys. F: Metal Phys., 11, 1.
Zaluzec, N.J. (1981) Library of Electron Energy Loss Spectra, Argonne National Laboratory Publication, Chicago, Illinois.
Egerton, R.F. and Whelan, M.J. (1974) Phil. Mag., 30, 739.
Spence, J.C.H. (1979) Ultramicroscopy, 4, 9.
Egerton, R.F. (1979) Ultramicroscopy, 4, 169.
Leapman, R.D., Rez, P. and Mayers, D.F. (1980) J. Chem. Phys., 72, 1232.
Joy, D.C. and Maher, D.M. (1982) J. Microscopy, 124, 37.
Davis, L.E., McDonald, C., Palmberg, P.W., Riach, G.E. and Weber, R.E. (1976) Handbook of Auger Electron Spectroscopy, 2nd edn, Physical Electronics Industries Inc., Minnesota, USA.
Seah, M.P. (1981) Analysis, 9, 171.
Goldstein, J.I., Costley, J.L., Lorimer, G.W. and Reed, S.J.B. (1971) in Scanning Electron Microscopy, Vol. 1, (ed. O. Johari) Chicago Press, Chicago, p. 315.
Jones, LP. and Loretto, M.H. (1981) J. Microscopy, 124, 3.
Reed, S.J.B. (1982) Ultramicroscopy, 7, 405.
Hutchings, R., Loretto, M.H., Jones, I.P. and Smallman, R E. (1979) Ultramicroscopy, 3, 401.
Stephenson, T., Loretto, M.H. and Jones, I.P. (1981) Quantitative Microanalysis with High Spatial Resolution, Metals Society, London.
Chang, C.C. (1974) Characterisation of Solid Surfaces, Plenum Press, New York.
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Loretto, M.H. (1984). Interpretation of Analytical Data. In: Electron Beam Analysis of Materials. Springer, Dordrecht. https://doi.org/10.1007/978-94-009-5540-0_6
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DOI: https://doi.org/10.1007/978-94-009-5540-0_6
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