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Theoretical Aspects of Polycrystalline Pattern Growth in Al/Ge Films

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Random Fluctuations and Pattern Growth: Experiments and Models

Part of the book series: NATO ASI Series ((NSSE,volume 157))

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Abstract

These notes discuss recent theoretical approaches to polycrystalline fingering during annealing of amorphous Al/Ge thin films, and compare them to experiment.

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References

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© 1988 Kluwer Academic Publishers

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Hilfer, R. (1988). Theoretical Aspects of Polycrystalline Pattern Growth in Al/Ge Films. In: Stanley, H.E., Ostrowsky, N. (eds) Random Fluctuations and Pattern Growth: Experiments and Models. NATO ASI Series, vol 157. Springer, Dordrecht. https://doi.org/10.1007/978-94-009-2653-0_23

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  • DOI: https://doi.org/10.1007/978-94-009-2653-0_23

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-0-7923-0073-1

  • Online ISBN: 978-94-009-2653-0

  • eBook Packages: Springer Book Archive

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