Abstract
A new circuit synthesis method is suggested. The method makes it possible to convert any part of an arbitrary circuit of functional elements into a form admitting fault detection with a detailed fault localization. Upper bounds for the complexities of the converted circuit and tests are established. The class of admissible faults is very wide with no restrictions imposed on the basis selection except for the requirement of completeness.
This research was partially supported by the Russian Foundation for Fundamental Research (Grant 94–01–00198).
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© 1996 Kluwer Academic Publishers
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Noskov, V.N. (1996). Fault Detection in Parts of the Circuits of Functional Elements. In: Korshunov, A.D. (eds) Discrete Analysis and Operations Research. Mathematics and Its Applications, vol 355. Springer, Dordrecht. https://doi.org/10.1007/978-94-009-1606-7_14
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DOI: https://doi.org/10.1007/978-94-009-1606-7_14
Publisher Name: Springer, Dordrecht
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