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Residual Stresses in Ceramics

  • C. O. Ruud
  • D. J. Snoha
  • C. P. Gazzara
  • P. Wong

Abstract

The Materials Research Laboratory of The Pennsylvania State University has developed an advanced XRD stress measuring instrument which provides for unprecedented stress measurement speed consistent with excellent accuracy.

Keywords

Residual Stress Silicon Nitride Residual Stress Measurement Titanium Diboride Material Research Laboratory 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

  1. (1) C.O. Ruud: Ind. Res, and Dev. Magazine (January, 1983) 1984Google Scholar
  2. (2).
    C.O. Ruud, P.S. DiMascio and D. J. Snoha: Adv. in X-Ray Anal.r 27 (1984) 273.CrossRefGoogle Scholar
  3. (3).
    C.O. Ruud and D. J. Snoha: J. Of Met. 36:2 (1984) 32.Google Scholar
  4. (4).
    SAE, “Residual Stress Measurement by X-Ray Diffraction-J78a,” Soc. of Auto. Eng., Warrendale, PA, (1971).Google Scholar
  5. (5).
    C.O. Ruud, P.S. DiMascio and D. M. Melsher: Adv. in X-Ray Anal. 29 (1983).Google Scholar
  6. (6).
    P.S. Prevey: Adv. in X-Ray Anal. 20 (1977) 345.Google Scholar
  7. (7).
    E.J. Bunning, D.R. Claxton and R.A. Giles: Presented at the Ceramic-Metal Systems Division, Fifth Annual Conf., Merrit Island, FL (January 20, 1981).Google Scholar

Copyright information

© Elsevier Science Publishers Ltd 1989

Authors and Affiliations

  • C. O. Ruud
    • 1
  • D. J. Snoha
    • 1
  • C. P. Gazzara
    • 2
  • P. Wong
    • 2
  1. 1.Materials Research LaboratoryThe Pennsylvania State UniversityUniversity ParkUSA
  2. 2.U.S. Army Materials Technology LaboratoryWatertownUSA

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