An Intelligent Workstation for Stress Determination Using X-Ray Diffraction

  • Christophe F. Dehan
  • Robert W. Hendricks
  • John W. Roach

Abstract

Recent hardware developments of automated, high speed, portable X-ray diffraction stress analysis instrumentation have not yet resulted in widespread use of the technique in industry despite its potentials. We suggest that these hardware developments require an equivalent development in the training of instrument operators in order to guarantee the integrity of the resulting data, as well as to enhance the understanding of such materials characterization data. The hurdle to date is the variety of skills necessary in a wide range of scientific and engineering disciplines and which are not commonly found in a single individual. It is proposed that a computer-based system, integrating knowledge bases, visualization and analysis tools and which is focused on human performance can provide an efficient solution to this problem.

Keywords

Residual Stress Expert System Laboratory Information Management System Desktop Machine Expert System Shell 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Elsevier Science Publishers Ltd 1989

Authors and Affiliations

  • Christophe F. Dehan
    • 1
  • Robert W. Hendricks
    • 1
  • John W. Roach
    • 2
  1. 1.Materials Engineering DepartmentVirginia Polytechnic Institute & State UniversityBlacksburgUSA
  2. 2.Computer Science DepartmentVirginia Polytechnic Institute & State UniversityBlacksburgUSA

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