Abstract
This paper describes the design and construction of a transportable X-ray diffractometer system for the measurement of stress on large components•
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References
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Macherauch, E and Wolfstieg, U., A modified diffractometer for X-ray stress measurements, Advances in X-ray analysis, 1977, 20, 369–377.
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Rund, C.O., Dimascio, P.S., and Snoha, D.J., A miniature instrument for residual stress measurement, Advances in X-ray Analysis, 1984, 27, 273–283.
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© 1989 Elsevier Science Publishers Ltd
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Lonsdale, D., Doig, P. (1989). The Development of a Transportable X-Ray Diffractometer for Measurement of Stress. In: Beck, G., Denis, S., Simon, A. (eds) International Conference on Residual Stresses. Springer, Dordrecht. https://doi.org/10.1007/978-94-009-1143-7_23
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DOI: https://doi.org/10.1007/978-94-009-1143-7_23
Publisher Name: Springer, Dordrecht
Print ISBN: 978-94-010-7007-2
Online ISBN: 978-94-009-1143-7
eBook Packages: Springer Book Archive