Segregation in ZrO2-Y2O3 Ceramics
The composition of grain boundaries and surfaces often control phenomena like sintering, grain growth, wear resistance and corrosion behaviour. In the present study the surface of zirconia ceramics doped with various amounts of Yttria was examined in order to find an explanation for observed differences in grain growth. This was done by using AES (Auger Electron Spectroscopy) and XPS (X-ray Photoelectron Spectroscopy). Specimen heat treated at 873K had a surface composition similar to their bulk composition. Specimen heat treated at 1273K showed a surface composition containing 30-34 at% Yttria independent of the bulkcomposition. This results in a larger solute drag for zirconia with low amounts of yttria which probably causes a slower grain growth by means of an impurity drag mechanism. It could be shown that the relative increase of the 76eV Augerline was not due to Silicon segregation but solely to the segragation of Yttrium.
KeywordsAuger Electron Spectroscopy Surface Composition Bulk Composition Peak Intensity Ratio Zirconia Ceramic
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