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FT-IR Characterization of High Surface Area Silicon Nitride and Carbide

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Surfaces and Interfaces of Ceramic Materials

Part of the book series: NATO ASI Series ((NSSE,volume 173))

Abstract

The surface chemistry of SiC and Si3N4 prepared by laser-driven gas-phase reactions has been characterized by transmission/absorption FT-IR spectroscopy. Different surface sites, such as surface silanols, silyl amino- and imido- groups, alkyl groups, silane bonds, surface carbonyls and siloxanes bridges have been evidenced. Their amounts depend on surface treatments: evacuation, oxidation, surface nitridation.

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© 1989 Kluwer Academic Publishers

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Ramis, G., Busca, G., Lorenzelli, V., Baraton, M.I., Merle-Mejean, T., Quintard, P. (1989). FT-IR Characterization of High Surface Area Silicon Nitride and Carbide. In: Dufour, LC., Monty, C., Petot-Ervas, G. (eds) Surfaces and Interfaces of Ceramic Materials. NATO ASI Series, vol 173. Springer, Dordrecht. https://doi.org/10.1007/978-94-009-1035-5_11

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  • DOI: https://doi.org/10.1007/978-94-009-1035-5_11

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-94-010-6957-1

  • Online ISBN: 978-94-009-1035-5

  • eBook Packages: Springer Book Archive

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