Abstract
The aim of this contribution is certainly not to provide a general course in electron microscopy, other and more elaborated works can be consulted for this purpose, e.g. [1,2]. We will only try to clarify these aspects of electron microscopy which are useful in the study of ordered alloys or in the evolution towards ordering. First we will study the symmetry aspects of the ordered alloy and predict the number of orientation as well as translation variants of the ordered phase in the disordered matrix. Due to the usual lowering of symmetry upon ordering a number of orientation and translation interfaces will result in ordered alloys. Their number and internal relationship can be predicted based on simple symmetry rules. The two dimensional defects related to ordering can be identified from electron microscope observations and sometimes produce specific electron diffraction effects. High resolution microscopy combined with computer simulated images allow to obtain atomic scale information of ordering related defects. Important is that we can show that the minority atoms in a large range of alloys can be systematically imaged as bright dots; this provides us with an easy code to interpret sometimes complex high resolution images.
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References
P.B. Hirsch, A. Howie, R.B. Nicholson, D.W. Pashley and M.J. Whelan, Electron Microscopy of Thin Crystals, Butterworths 1965.
Diffraction and Imaging Techniques in Material Science, Eds. S. Amelinckx, R. Gevers and J. Van Landuyt, North Holland Publishing Co., Amsterdam (1978).
G. Van Tendeloo, S. Amelinckx and D. de Fontaine, Acta Cryst. B41, 281 (1985).
G. Van Tendeloo, S. Amelinckx, Acta Cryst. A30, 431 (1974).
R. Portier and D. Gratias, Journal de Physique 43, C4–17 (1982).
A. Finel, D. Gratias and R. Portier, in: L’ordre et le désordre dans les matériaux, Ecole d’Hiver (Aussois) 1984, Les Editions de Physique, Les Ulis Cedex (France).
J.W. Cahn and G. Kalonji in: “Solid-solid phase transformations”, eds. H.I. Aaronson, D.E. Laughlin, R.F. Sekerka and CM. Wayman, AIME publications (1982).
M.A. Melvin, Rev. Mod. Phys. 28, 18 (1956).
G. Van Tendeloo, S. Amelinckx, Phys. stat. sol. (a) 22, 621 (1974).
C. Boulesteix, Phys. stat. sol. (a) 86, 11 (1984).
R. Serneels, M. Snykers, P. Delavignette, R. Gevers, S. Amelinckx, Phys. stat. sol. (b) 58, 277 (1973).
A.J. Morton, Phys. stat. sol. (a) 44, 205 (1977).
A.J. Morton, Acta Metal. 27, 863 (1979).
M. Snykers, P. Delavignette, S. Amelinckx, Phys. stat. sol. (a) 48, K1 (1971).
J.W. Edington, Practical Electron Microscopy in Materials Science nr. 5, Philips (1975).
J.C.H. Spence, “Experimental High Resolution Electron Microscopy”, Clarendon Press Oxford (1981).
D. Van Dyck Diffraction and Imaging Techniques in Material Science, Eds. S. Amelinckx, R. Gevers and J. Van Landuyt, North Holland Publishing Co., Amsterdam (1978), p. 355.
D. Van Dyck, J. Microscopy 119, 141 (1980).
D. Van Dyck, G. Van Tendeloo and S. Amelinckx, Ultramicroscopy 10, 263 (1982).
G. Van Tendeloo, D. Van Dyck, S. Amelinckx, Ultramicroscopy 19, 235 (1986).
I. Baele, G. Van Tendeloo and S. Amelinckx, Acta Metall. 35, 401 (1987).
“Crystal growth and characterization of polytype structures” ed. P. Krishna, Pergamon Press (1983).
C.H. Johansson and J.O. Linde, Ann. Phys. 25, 1 (1936).
J. Van Landuyt, R. De Ridder, R. Gevers and S. Amelinckx, Mat. Res. Bull. 5, 353 (1970).
A.B. Glossop and D. Pashley, Proc. Royal Soc. A250, 132 (1959).
D. Schryvers, G. Van Tendeloo, J. Van Landuyt, S. Amelinckx, Phys. stat. sol. (a) 75, 607 (1983).
A. Loiseau, G. Van Tendeloo, R. Portier and F. Ducastelle, J, Phys. (Paris) 46, 595 (1985).
D. Broddin, G. Van Tendeloo, J. Van Landuyt, S. Amelinckx, R. Portier, M. Guymont and A. Loiseau, Phil. Mag. A 54, 395 (1986).
J. Gjønnes, Acta Cryst. 20, 240 (1966).
J. Cowley, R. Murray, Acta cryst. A24, 329 (1968).
R. De Ridder, G. Van Tendeloo, S. Amelinekx, Acta Cryst. A32, 216 (1976).
R. De Ridder, G. Van Tendeloo, D. Van Dyck, S. Amelinekx, Phys. stat. sol. (a) 38, 663 (1976)
R. De Ridder, G. Van Tendeloo, D. Van Dyck, S. Amelinekx, Phys. stat. sol. (a) 43, 541 (1977).
B. Chakravarti, C.J. Sparks, E.A. Starke, R.O. Williams, J. Phys. Chem. Solids 35, 1317 (1974).
K. Ohshima, J. Harada, M. Matsui, K. Adachi, J. Magn. Mater. 54–57, 157 (1986).
N. Tanaka, J.M. Cowley and K. Ohshima, Acta Cryst. B43, 41 (1987).
G. Van Tendeloo, R. De Ridder, S. Amelinekx, Phys. stat. sol. (a) 49, 655 (1978).
J. W. Steeds in “Introduction to Analytical Electron Microscopy” Eds. J.J. Hren, J.I. Goldstain, D.C. Joy, Plenum Press, New York, 1979.
“Principles of Analytical Electron Microscopy”, eds. D.C. Joy, A.D. Romig,Jr., J.I. Goldstein, Plenum Press, New York, 1986.
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© 1989 Kluwer Academic Publishers
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Van Tendeloo, G. (1989). Electron Microscopy of Ordering in Alloys. In: Stocks, G.M., Gonis, A. (eds) Alloy Phase Stability. NATO ASI Series, vol 163. Springer, Dordrecht. https://doi.org/10.1007/978-94-009-0915-1_6
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DOI: https://doi.org/10.1007/978-94-009-0915-1_6
Publisher Name: Springer, Dordrecht
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