Proportional Hazards Analysis of Electronic Component Reliability Data
This paper addresses the challenge of analysing electronic component reliability data arising in diverse environments and applications. Most reliability data has such potential associated explanatory variables, the electronic component reliability data analysed in this paper is no exception. MIL HDBK 217E accounts for these explanatory variables by incorporating n factors. These factors are determined a-priori and give the magnitude and effect of the explanatory variables.
The data analysed in this paper originates from the field failure of electronic components database held at Loughborough University of Technology (LUT). This database is part of a joint project funded by the British MOD, with participants from both electronics companies and academic institutions, namely, STC, GEC, Plessey, LUT, Nottingham Polytechnic and the Danish Engineering Academy (DIA).
The proportional Hazards Model (PHM) has been employed in an exploratory approach and includes such covariates as system operational environment and data source. This paper presents the results on the application of PHM to field data on Bipolar Transistors (T1A) and provides an insight into those factors which significantly influence the failure of these types of devices.
KeywordsElectronic Component Component Type Bipolar Transistor Electronic Company Accelerate Life Test
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