Abstract
We study a two-dimensional model of the scattering of p- and s-polarized light, emitted by a coated tapered glass fiber, from a metal surface with a topographic or an optical defect. We calculate the intensity of the scattered electromagnetic field at the center of the bottom of the fiber, and the integrated intensity of the field scattered back through the fiber, as it is moved at constant height above the perturbed metal surface. The position and width of surface defects can be determined from these calculations with subwavelength resolution, although the intensities bear no simple relation to the surface scanned.
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© 1996 Kluwer Academic Publishers
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Maradudin, A.A., Mendoza-Suárez, A., Méndez, E.R., Nieto-Vesperinas, M. (1996). A Numerical Study of a Model Near-Field Optical Microscope. In: Nieto-Vesperinas, M., García, N. (eds) Optics at the Nanometer Scale. NATO ASI Series, vol 319. Springer, Dordrecht. https://doi.org/10.1007/978-94-009-0247-3_3
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DOI: https://doi.org/10.1007/978-94-009-0247-3_3
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