6 NM Lateral Resolution in Scanning Near Field Optical Microscopy with the Tetrahedral Tip

  • J. Koglin
  • U. C. Fischer
  • H. Fuchs
Part of the NATO ASI Series book series (NSSE, volume 319)


We realized a combination of a scanning near field optical (SNOM) and a scanning tunneling microscope (STM) using the tetrahedral tip as a probe. The SNOM and the STM signal are acquired simultaneously during the scan. In the STM mode atomic resolution on pyrolytic graphite is routinely obtained. Simultaneous SNOM/STM investigations of thin silver films evaporated on glass show a lateral resolution of 6 nm in the near field optical signal. Absorption contrast in the optical image is obtained in images of evaporated silver films as well as of patches of purple membrane deposited on indium tin oxide (ITO) as a substrate.


Scanning Tunneling Microscope Image Highly Orientate Pyrolytic Graphite Silver Film Purple Membrane Absorption Contrast 
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Copyright information

© Kluwer Academic publishers 1996

Authors and Affiliations

  • J. Koglin
    • 1
  • U. C. Fischer
    • 1
  • H. Fuchs
    • 1
  1. 1.Physikalisches InstitutWestfälische-Wilhelms Universität MünsterMünsterGermany

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