Abstract
We developed a new scanning near-field optical microscope (scanning near-field optical/atomic-force microscope; SNOM-AFM). In SNOM-AFM, we took advantage of non-contact atomic force microscopy (AFM) to control the tip-sample distance for scanning near-field optical microscopy (SNOM) without mechanical damages of the tip and sample surfaces. By the precise control of the distance of the optical fiber tip within 100 nm from the sample surface, we succeeded in observing fluorescence micrographs and also fluorescence spectra for localized micro-areas of various samples. These results observed previously will be summarized in this review.
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Fujihira, M. (1996). Fluorescence Microscopy and Spectroscopy by Scanning Near-Field Optical/Atomic Force Microscope (SNOM-AFM). In: Nieto-Vesperinas, M., García, N. (eds) Optics at the Nanometer Scale. NATO ASI Series, vol 319. Springer, Dordrecht. https://doi.org/10.1007/978-94-009-0247-3_15
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DOI: https://doi.org/10.1007/978-94-009-0247-3_15
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