Skip to main content

Bayesian Consideration of the Tomography Problem

  • Conference paper
  • 337 Accesses

Part of the Fundamental Theories of Physics book series (FTPH,volume 70)

Abstract

Soft X-ray tomography has become a standard diagnostic equipment to investigate plasma profiles. Due to limitations in viewing-access and detector numbers the reconstruction of the two-dimensional emissivity profile constitutes a highly underdetermined inversion problem. We discuss the principle features of the tomography problem from the Bayesian point of view in various stages of sophistication. The approach is applied to real-world data obtained from the Wendelstein 7AS stellerator.

Keywords

  • Maximum Entropy
  • Emissivity Profile
  • Tomography Problem
  • Default Model
  • Effective Atomic Number

These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

This is a preview of subscription content, access via your institution.

Buying options

Chapter
USD   29.95
Price excludes VAT (USA)
  • DOI: 10.1007/978-94-009-0107-0_5
  • Chapter length: 9 pages
  • Instant PDF download
  • Readable on all devices
  • Own it forever
  • Exclusive offer for individuals only
  • Tax calculation will be finalised during checkout
eBook
USD   169.00
Price excludes VAT (USA)
  • ISBN: 978-94-009-0107-0
  • Instant PDF download
  • Readable on all devices
  • Own it forever
  • Exclusive offer for individuals only
  • Tax calculation will be finalised during checkout
Softcover Book
USD   219.99
Price excludes VAT (USA)
Hardcover Book
USD   249.00
Price excludes VAT (USA)

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

Reference

  1. A.P.Navarro, V.K. Paré, and J.L. Dunlap, Rev.Sci.Instrum. 52, 1634 (1981)

    CrossRef  Google Scholar 

  2. R.S. Granetz and J. Camacho, Nucl. Fusion 25, 727 (1985).

    CrossRef  Google Scholar 

  3. J. Camacho and R.S. Granetz, Rev.Sci.Instrum. 57, 417 (1986).

    CrossRef  Google Scholar 

  4. N.R. Sauthoff,K.M. McGuire, and S. von Goeler, Rev.Sci.Instrum. 57, 2139 (1986).

    CrossRef  Google Scholar 

  5. E.T. Jaynes, (1958).

    Google Scholar 

  6. S.F. Gull, in Maximum Entropy and Bayesian Methodsed. J. Skilling, (Kluwer, Academic Publishers, 1989 ).

    Google Scholar 

  7. J. Skilling, in Maximum Entropy and Bayesian Methodsed. P. F. Fougère, (Kluwer, Academic Publishers, 1990 ).

    Google Scholar 

  8. R. Silver, in Maximum Entropy and Bayesian Methods ed. G. Heidbreder, (Kluwer, Academic Publishers, 1993), to be published.

    Google Scholar 

  9. B. Roy Frieden, J. Opt.Soc.Am. 62, 511 (1972)

    CrossRef  Google Scholar 

  10. G.A.Cottrell, in Maximum Entropy in Action, ed. B. Buck and V. A. Macaulay, (Oxford Science Publications,Oxford 1990)

    Google Scholar 

  11. A. Holland and G.A.Navrati, Rev.Sci.Instrum. 57, 1557 (1986).

    CrossRef  Google Scholar 

  12. K. Bockasten, J.Opt.Soc.Amer. 51, 943 (1961).

    CrossRef  Google Scholar 

  13. N.R. SauthofT, S. von Goeler, and W. Stodiek, Nucl. Fusion 18, 1445 (1978).

    CrossRef  Google Scholar 

  14. N.R. SauthofT and S. von Goeler, IEEE Trans.Plasma.Sci. 7, 141 (1979).

    CrossRef  Google Scholar 

  15. A.P. Navarro, M.A. Ochando, and A. Weiler, IEEE Trans, on Plasma Science 19, 569 (1991).

    CrossRef  Google Scholar 

  16. R. Decoste, Rev.Sci.Instrum. 56, 807 (1985).

    CrossRef  Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Editor information

Editors and Affiliations

Rights and permissions

Reprints and Permissions

Copyright information

© 1996 Kluwer Academic Publishers

About this paper

Cite this paper

von der Linden, W., Ertl, K., Dose, V. (1996). Bayesian Consideration of the Tomography Problem. In: Skilling, J., Sibisi, S. (eds) Maximum Entropy and Bayesian Methods. Fundamental Theories of Physics, vol 70. Springer, Dordrecht. https://doi.org/10.1007/978-94-009-0107-0_5

Download citation

  • DOI: https://doi.org/10.1007/978-94-009-0107-0_5

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-94-010-6534-4

  • Online ISBN: 978-94-009-0107-0

  • eBook Packages: Springer Book Archive