Abstract
Line Profile Analysis is the common name given to those methods allowing microstructure information to be extracted from the breadth and shape of the peaks in a diffraction pattern. A fast analysis is always possible via traditional techniques such as the Scherrer formula, Williamson-Hall plot and Warren-Averbach method, but at the expenses of the physical meaning of the result. A more sound alternative is offered by the Whole Powder Pattern Modelling, allowing physical information to be extracted from diffraction data in a self-consistent way.
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Acknowledgments
The author wishes to thank Prof. P. Scardi for continuous support, critical reading and useful discussions. The PM2K software implementing the WPPM method and the DIFFaX+ code for the analysis of systems with heavy faulting are both available on request from the author. A free license is granted for academic and non-profit use.
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Leoni, M. (2012). Information on Imperfections. In: Kolb, U., Shankland, K., Meshi, L., Avilov, A., David, W. (eds) Uniting Electron Crystallography and Powder Diffraction. NATO Science for Peace and Security Series B: Physics and Biophysics. Springer, Dordrecht. https://doi.org/10.1007/978-94-007-5580-2_16
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DOI: https://doi.org/10.1007/978-94-007-5580-2_16
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