Abstract
ChapterĀ 5 presents the theory and critical issues associated with highly reflective load-pull systems required for the characterization and measurement of high-power transistor devices. The theory and analysis of the impedance transforming network between the device under test (DUT) and the load-pull system, which is needed to overcome problems encountered in high-power load-pull measurements, is discussed in detail. Multi-tier calibration and de-embedding techniques, which are required for accurate data extraction during high-power DUT characterization, are also presented.
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Ghannouchi, F.M., Hashmi, M.S. (2013). High-Power Load-Pull Systems. In: Load-Pull Techniques with Applications to Power Amplifier Design. Springer Series in Advanced Microelectronics, vol 32. Springer, Dordrecht. https://doi.org/10.1007/978-94-007-4461-5_5
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DOI: https://doi.org/10.1007/978-94-007-4461-5_5
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