Six-Port Based Load-Pull System

  • Fadhel M. Ghannouchi
  • Mohammad S. Hashmi
Part of the Springer Series in Advanced Microelectronics book series (MICROELECTR., volume 32)


Chapter 4 provides a detailed treatment of six-port based setups for passive and active load/source-pull measurements, as well as a description of six-port based harmonic load/source-pull measurements. The load-pull measurements for on-wafer devices require special attention; therefore, an alternative approach for impedance and power flow calibration using a reflection based technique is described.


Reflection Coefficient Output Port Input Port Reference Plane Device Under Test 
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  1. 1.
    F.M. Ghannouchi, R. Larose, R.G. Bosisio, Y. Demers, A six-port network analyzer load-pull system for active load tuning. IEEE Trans. Instrum. Meas. 39(4), 628–631 (1990) CrossRefGoogle Scholar
  2. 2.
    R. Hajji, F.M. Ghannouchi, R.G. Bosisio, Large-signal microwave transistor modeling using multiharmonic load-pull measurements. Microw. Opt. Technol. Lett. 5(11), 580–585 (1992) ADSCrossRefGoogle Scholar
  3. 3.
    F.M. Ghannouchi, R.G. Bosisio, An automated millimeter-wave active load-pull measurement system based on six-port techniques. IEEE Trans. Instrum. Meas. 41(6), 957–962 (1992) CrossRefGoogle Scholar
  4. 4.
    F.M. Ghannouchi, F. Beauregard, A.B. Kouki, Large-signal stability and spectrum characterization of a medium power HBT using active load-pull techniques. IEEE Microw. Guided Wave Lett. 4(6), 191–193 (1994) CrossRefGoogle Scholar
  5. 5.
    F.M. Ghannouchi, G. Zhao, F. Beauregard, Simultaneous load-pull of intermodulation and output power under two tone excitation for accurate SSPA design. IEEE Trans. Microw. Theory Tech. 42(6), 943–950 (1994) CrossRefGoogle Scholar
  6. 6.
    F.M. Ghannouchi, F. Beauregard, R. Hajji, A. Brodeur, A de-embedding technique for reflection-based s-parameters measurements of HMICs and MMICs. Microw. Opt. Technol. Lett. 10(4), 218–222 (1995) CrossRefGoogle Scholar
  7. 7.
    R. Hajji, F. Beanregard, F.M. Ghannouchi, Multitone power and intermodulation load-pull characterization of microwave transistors suitable for linear Sspa’s design. IEEE Trans. Microw. Theory Tech. 45(7), 1093–1099 (1997) ADSCrossRefGoogle Scholar
  8. 8.
    D. Le, F.M. Ghannouchi, Multitone characterization and design of FET resistive mixers based on combined active source-pull/load-pull techniques. IEEE Trans. Instrum. Meas. 46(9), 1201–1208 (1998) Google Scholar
  9. 9.
    G. Berghoff, E. Bergeault, B. Huyart, L. Jallet, Automated characterization of HF power transistors by source-pull and multiharmonic load-pull measurements based on six-port techniques. IEEE Trans. Microw. Theory Tech. 46(12), 2068–2073 (1998) ADSCrossRefGoogle Scholar
  10. 10.
    S. Jia, New application of a single six-port reflectometer. Electron. Lett. 20, 920–922 (1984) CrossRefGoogle Scholar
  11. 11.
    J.D. Hunter, P.I. Slomo, S-parameter measurements with a single six-port. Electron. Lett. 21, 157–158 (1985) CrossRefGoogle Scholar
  12. 12.
    F.M. Ghannouchi, A. Mohammadi, The Six-Port Technique (Artech House, Norwood, 2009) Google Scholar
  13. 13.
    D. Le, F.M. Ghannouchi, Source-pull measurements using reverse six-port reflectometers with application to MESFET mixer design. IEEE Trans. Microw. Theory Tech. 42, 1589–1595 (1994) ADSCrossRefGoogle Scholar
  14. 14.
    T.E. Hodgetts, G.J. Griffin, A unified treatment of the six-port reflectometer calibration using a minimum of standards, Royal Signals and Radar Establishment Rep. No. B3003, 1983 Google Scholar
  15. 15.
    G.F. Engen, Calibrating the six-port reflectometer by means of sliding terminations. IEEE Trans. Microw. Theory Tech. 26, 951–957 (1978) ADSCrossRefGoogle Scholar
  16. 16.
    V. Teppati, A. Ferrero, U. Pisani, Recent advances in real-time load-pull systems. IEEE Trans. Instrum. Meas. 57, 2640–2646 (2008) CrossRefGoogle Scholar
  17. 17.
    D. Le, F.M. Ghannouchi, Noise measurements of microwave transistors using an uncalibrated mechanical stub tuner and a built-in reverse six-port reflectometer. IEEE Trans. Instrum. Meas. 44(4), 847–852 (1995) CrossRefGoogle Scholar
  18. 18.
    R.Q. Lane, Determination of device noise parameters. Proc. IEEE 57, 1461–1462 (1969) CrossRefGoogle Scholar
  19. 19.
    S.V. Bosch, L. Martens, Experimental verification of pattern selection for noise characterization. IEEE Trans. Microw. Theory Tech. 48(1), 156–158 (2000) ADSCrossRefGoogle Scholar
  20. 20.
    F.M. Ghannouchi, R. Larose, R.G. Bosisio, A new multiharmonic loading method for large-signal microwave transistor characterization. IEEE Trans. Microw. Theory Tech. 39, 986–992 (1991) ADSCrossRefGoogle Scholar
  21. 21.
    G. Gonzalez, Microwave Transistor Amplifiers Analysis and Design, 2nd edn. (Prentice-Hall, Englewood Cliffs, 1996) Google Scholar
  22. 22.
    F.M. Ghannouchi, R.G. Bosisio, Source-pull/load-pull oscillator measurements at microwave/mm wave frequencies. IEEE Trans. Instrum. Meas. 41, 32–35 (1992) CrossRefGoogle Scholar
  23. 23.
    T. Yakabe, M. Kinoshita, H. Yabe, Complete calibration of a six-port reflectometer with one sliding load and one short. IEEE Trans. Microw. Theory Tech. 42, 2035–2039 (1994) ADSCrossRefGoogle Scholar
  24. 24.
    K. Koyama, T. Kawasaki, J.E. Hanely, Measurement of AM-PM conversion coefficients. Telecommun. 12(6), 25–28 (1978) Google Scholar
  25. 25.
    J.F. Moss, AM-AM and AM-PM measurements using the PM null technique. IEEE Trans. Microw. Theory Tech. MTT-35(8), 780–782 (1987) ADSCrossRefGoogle Scholar
  26. 26.
    T. Parra, X-band low phase distortion MMIC power limiter. IEEE Trans. Microw. Theory Tech. 41(5), 876–879 (1993) ADSCrossRefGoogle Scholar
  27. 27.
    R.A. Soares, P. Gouzien, P. Legaud, G. Follot, A unified mathematical approach to two-port calibration techniques and some applications. IEEE Trans. Microw. Theory Tech. MTT-37, 1660–1674 (1989) ADSGoogle Scholar

Copyright information

© Springer Science+Business Media Dordrecht 2013

Authors and Affiliations

  1. 1.Electrical and Computer Engineering, Intelligent RF Radio LaboratoryUniversity of CalgaryCalgaryCanada

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