Abstract
This book describes our efforts related to the difficulty in adapting a well-established system, like the electron microscope, to new uses and functions as demanded by new markets, or by changes in the current markets. We call this inherent and designed-in inability to respond to changes ‘architectural stress’.
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Doornbos, R., van Loo, S. (2012). Final Words. In: Doornbos, R., van Loo, S. (eds) From scientific instrument to industrial machine. SpringerBriefs in Electrical and Computer Engineering(). Springer, Dordrecht. https://doi.org/10.1007/978-94-007-4147-8_8
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DOI: https://doi.org/10.1007/978-94-007-4147-8_8
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