Abstract
Automation of measurements and automatic analysis of samples on a transmission electron microscope enables a large variety of new microscopy applications suited for industrial needs. The consequences of these new possibilities are profound. The current methods for performing measurements and analysis should be considered carefully in order to find the optimal procedures and conditions needed to deliver the required accuracy or throughput. This chapter shows how to design an automated microscopy application using a model-based approach for one specific application, viz. the size analysis of a mixture of particles.
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Acknowledgments
The author likes to acknowledge Max Otten from FEI for sharing his experience in probe formation.
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Doornbos, R., van Loo, S. (2012). Applications in Automated Microscopy. In: Doornbos, R., van Loo, S. (eds) From scientific instrument to industrial machine. SpringerBriefs in Electrical and Computer Engineering(). Springer, Dordrecht. https://doi.org/10.1007/978-94-007-4147-8_5
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DOI: https://doi.org/10.1007/978-94-007-4147-8_5
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