Teraherz Pulse Near-Field Microscopes
We review the recent progress in the terahertz (THz) apertureless near-field microscopes. We demonstrate quantitative analysis and measurements of the THz near-fields interactions in the probe-sample system. We also present a self-consistent line dipole image method for the quantitative analysis of the near-field interaction. The measurements of approach curves and relative contrasts on gold and silicon substrates were in excellent agreement with calculations based on the self-consistent line dipole image method.
KeywordsGaAs Substrate Tuning Fork Piezo Actuator Quartz Tuning Fork Probe Sphere
- 6.Park, H., Kim, J., Han, H.: THz pulse near-field microscope with nanometer resolution, presented at the 35th workshop: physics and technology of THz photonics 2005, pp. 20–26. Erice, Italy (July 2005)Google Scholar
- 7.Park, H., Kim, J., Kim, M., Han, H., Park, I.: Terahertz near-field microscope, presented at the Joint 31st International Conference on Infrared Millimeter Waves and 14th International Conference on Terahertz Electronics (IRMMW-THz 2006), pp. 18–22. Shanghai, China (September 2006)Google Scholar
- 27.Ordal, M.A., Bell, R.J., Alexander, R.W.Jr., Long, L.L and Querry, M.R.: Optical properties of fourteen metals in the infrared and far infrared: Al, Co, Cu, Au, Fe, Pb, Mo, Ni, Pd, Pt, Ag, Ti, V, and W. Appl. Opt. 24(24), 4493–4499 (1985)Google Scholar
- 28.Kulawik, M., Nowicki, M., Thielsch, G., Cramer, L., Rust, H.-P., Freund, H.-J., Pearl, T.P., and Weiss, P.S.: A double lamellae dropoff etching procedure for tungsten tips attached to tuning fork atomic force microscopy/scanning tunneling microscopy sensors. Rev. Sci. Instrum. 74(2), 1027–1030 (2003)Google Scholar