Systematic and Random Variability

Of Measured Results
  • Gustavo Neuberger
  • Gilson Wirth
  • Ricardo Reis


The total variability observed in the measured data may come from different sources. They may be wafer-to-wafer, die-to-die, intra-die, and may come from systematic or random sources.


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Copyright information

© Springer Science+Business Media Dordrecht 2014

Authors and Affiliations

  • Gustavo Neuberger
    • 1
  • Gilson Wirth
    • 2
  • Ricardo Reis
    • 3
  1. 1.Instituto Federal de EducaçãoCiência e Tecnologia do Rio Grande do Sul(IFRS) CampusCanoas CanoasBrazil
  2. 2.Depto de Eng ElétricaUniversidade Federal do Rio Grande do Sul (UFRGS)Porto AlegreBrazil
  3. 3.Instituto de InformáticaUniversidade Federal do Rio Grande do Sul (UFRGS)Porto AlegreBrazil

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