Experimental Results

Of Fabricated Circuits
  • Gustavo Neuberger
  • Gilson Wirth
  • Ricardo Reis


In this chapter, we discuss the setup of the equipments needed to perform the measurements, and results found in these measurements. First, the basic setup is shown; and then the measurement flow followed in each circuit measurement is drawn. All the measured data with the different combinations (technologies, temperature, Vdd’s) is shown in the second part of this chapter.


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    ZARKESH-HA, P.; MULE, T.; MEINDL, J. D. Characterization and Modeling of Clock Skew with Process Variations. In: IEEE Custom Integrated Circuits, 1999. Proceedings… [S.l.]: IEEE, 1999. p. 441–444.Google Scholar

Copyright information

© Springer Science+Business Media Dordrecht 2014

Authors and Affiliations

  • Gustavo Neuberger
    • 1
  • Gilson Wirth
    • 2
  • Ricardo Reis
    • 3
  1. 1.Instituto Federal de EducaçãoCiência e Tecnologia do Rio Grande do Sul(IFRS) CampusCanoas CanoasBrazil
  2. 2.Depto de Eng ElétricaUniversidade Federal do Rio Grande do Sul (UFRGS)Porto AlegreBrazil
  3. 3.Instituto de InformáticaUniversidade Federal do Rio Grande do Sul (UFRGS)Porto AlegreBrazil

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