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Measurement Circuits

For Precise Characterization
  • Gustavo Neuberger
  • Gilson Wirth
  • Ricardo Reis
Chapter

Abstract

In this chapter, it is shown all circuits that are needed to perform the measurement of the test circuits on wafer, as published in [30]. First, the delay line that will produce the artificial skew between the FF clocks is discussed. Then the ring oscillator needed to calibrate the delay line is showed. The next step is the design of a shift register to reduce the number of inputs. Finally, we put it all together and show the final layout.

References

  1. 33.
    NEUBERGER, G.; KASTENSMIDT, F.; REIS, R.; WIRTH, G.; BREDERLOW, R.; PACHA, C. Statistical Characterization of Hold Time Violations in 130nm CMOS Technology. In: European Solid-State Circuits Conference, 32., 2006, Montreux. Proceedings… Piscataway: IEEE, 2006. p. 114–117.Google Scholar

Copyright information

© Springer Science+Business Media Dordrecht 2014

Authors and Affiliations

  • Gustavo Neuberger
    • 1
  • Gilson Wirth
    • 2
  • Ricardo Reis
    • 3
  1. 1.Instituto Federal de EducaçãoCiência e Tecnologia do Rio Grande do Sul(IFRS) CampusCanoas CanoasBrazil
  2. 2.Depto de Eng ElétricaUniversidade Federal do Rio Grande do Sul (UFRGS)Porto AlegreBrazil
  3. 3.Instituto de InformáticaUniversidade Federal do Rio Grande do Sul (UFRGS)Porto AlegreBrazil

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