Circuits Under Test

For Characterization
  • Gustavo Neuberger
  • Gilson Wirth
  • Ricardo Reis
Chapter

Abstract

The circuits can be very sensitive to process variability, but different circuits can have different sensibilities. To have representative results, the circuits that will be fabricated to be tested must be carefully chosen. First, the sensitivity of the logic circuits will be verified through simulation in 130 and 90 nm technologies, however only the results for 90 nm will be shown in this chapter. Using MC simulations, the sensitivity of inverters (representing generic combinational circuits) and FFs will be measured. Combining them, we will verify if hold time violations are a potential problem, and if they can be generated by process variations. Finally, the circuits chosen for fabrication and measurement in silicon will be shown.

References

  1. 19.
    GEROSA, G. et al. A 2.2W, 80 MHz Superscalar RISC Microprocessor. IEEE Journal of Solid-State Circuits, New York, v. 29, n. 12, p. 1440–1454, Dec. 1994.Google Scholar

Copyright information

© Springer Science+Business Media Dordrecht 2014

Authors and Affiliations

  • Gustavo Neuberger
    • 1
  • Gilson Wirth
    • 2
  • Ricardo Reis
    • 3
  1. 1.Instituto Federal de EducaçãoCiência e Tecnologia do Rio Grande do Sul(IFRS) CampusCanoas CanoasBrazil
  2. 2.Depto de Eng ElétricaUniversidade Federal do Rio Grande do Sul (UFRGS)Porto AlegreBrazil
  3. 3.Instituto de InformáticaUniversidade Federal do Rio Grande do Sul (UFRGS)Porto AlegreBrazil

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