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Final Remarks

  • Gustavo Neuberger
  • Gilson Wirth
  • Ricardo Reis
Chapter

Abstract

The current IC technologies are subject to an increasingly sensitivity to process variations. These variations affect the design of digital circuit in different ways. The focus of this book is the effect of variability on hold time violations.

Keywords

Digital Circuit Test Circuit Delay Element Process Variability Detailed Experimental Study 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Copyright information

© Springer Science+Business Media Dordrecht 2014

Authors and Affiliations

  • Gustavo Neuberger
    • 1
  • Gilson Wirth
    • 2
  • Ricardo Reis
    • 3
  1. 1.Instituto Federal de EducaçãoCiência e Tecnologia do Rio Grande do Sul(IFRS) CampusCanoas CanoasBrazil
  2. 2.Depto de Eng ElétricaUniversidade Federal do Rio Grande do Sul (UFRGS)Porto AlegreBrazil
  3. 3.Instituto de InformáticaUniversidade Federal do Rio Grande do Sul (UFRGS)Porto AlegreBrazil

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