Analysis and Test of the Exposure Synchronization of the Multi-Sensor Aerial Photogrammetric Camera System

Conference paper
Part of the Lecture Notes in Electrical Engineering book series (LNEE, volume 107)

Abstract

Detailed analysis of exposure synchronization is made aiming at high precision matching and combining the images captured by multi sensor camera system. Exposure mechanism and motion of shutter blades or curtains become the main source of asynchronic error among individual cameras. Two methods are used to test the exposure asynchronization according to both between lens shutter and focal plane shutter configurations. Analysis of the results shows the consistency of theoretical analysis and test measurements.

Keywords

Exposure synchronization Multi-sensor aero photogrammetric camera Shutter configuration Ground sample distance 

References

  1. 1.
    Deren LI, Wang S, Zhou Y (2008) Introduction to photogrammetry and remote sensing. Surveying and Mapping Publication, BeijingGoogle Scholar
  2. 2.
    Qian Y (2006) Principle and use of modern camera. Zhejiang Photography Publication, ZhejiangGoogle Scholar
  3. 3.
    Du Y, Liu B, Cao J, Zhang BH, Hu BL, Tang Y, Wang H, Lu M (2008) Control system of aviation digital camera based on P89C668 SCM. Comput Eng Des 29(1):129–141Google Scholar
  4. 4.
    Zhang Z (2004) Aspects on aerial digital cameras. Eng Surv Mapp 13(4):1–5Google Scholar
  5. 5.
    Talley BB (1938) Multiple lens aerial cameras, chapter IV in aerial and terrestrial photogrammetry. Pitman Publishing Corporation, Chicago, pp 91–116Google Scholar
  6. 6.
    D Light (2004) A basis for estimating digital camera parameters. Photogramm Eng Remote Sens 70:297–300Google Scholar
  7. 7.
    Jacobsen K (1988) Handling of panoramic and extreme high oblique photographs in analytical plotters, ISPRS congress Kyoto. Int Arch PhRS XXVII B2, pp 232–237Google Scholar
  8. 8.
    Schroth RW (2008) The challenge of process and management optimization for photogrammetric mapping. In: Proceedings of the colloquium for the 60th birthday of Prof. M. Ehlers, OsnabruckGoogle Scholar

Copyright information

© Springer Science+Business Media B.V. 2012

Authors and Affiliations

  1. 1.Chinese Academy of Surveying and MappingBeijingChina
  2. 2.China TopRS Technology Co.LtdBeijingChina

Personalised recommendations