Self-Freeze Linear Decompressors: Test Pattern Generators for Low Power Scan Testing

Conference paper
Part of the Lecture Notes in Electrical Engineering book series (LNEE, volume 105)


Even though linear decompressors constitute a very effective solution for compressing test data, they cause increased shift power dissipation during scan testing. Recently, new linear decompression architectures were proposed which offer reduced shift power at the expense however of increased test data volume and test sequence length. This chapter presents a linear encoding method which offers both high compression and low shift power dissipation at the same time. A low-cost, test-set-independent scheme is also described which can be combined with any linear decompressor for reducing the shift power during testing. Extensive experiments show that the new method offers reduced test power dissipation, test sequence length and test data volume at the same time, with very small area requirements.


LFSR Scan testing Low switching activity 



This work is co-financed by the European Union (European Social Fund – ESF) and Greek national funds through the Operational Program "Education and Lifelong Learning" of the National Strategic Reference Framework (NSRF) — Research Funding Program: Heracleitus II. Investing in knowledge society through the European Social Fund.


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Copyright information

© Springer Science+Business Media B.V. 2011

Authors and Affiliations

  1. 1.Department of Computer ScienceUniversity of IoanninaIoanninaGreece

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