Self-Freeze Linear Decompressors: Test Pattern Generators for Low Power Scan Testing
Even though linear decompressors constitute a very effective solution for compressing test data, they cause increased shift power dissipation during scan testing. Recently, new linear decompression architectures were proposed which offer reduced shift power at the expense however of increased test data volume and test sequence length. This chapter presents a linear encoding method which offers both high compression and low shift power dissipation at the same time. A low-cost, test-set-independent scheme is also described which can be combined with any linear decompressor for reducing the shift power during testing. Extensive experiments show that the new method offers reduced test power dissipation, test sequence length and test data volume at the same time, with very small area requirements.
KeywordsLFSR Scan testing Low switching activity
This work is co-financed by the European Union (European Social Fund – ESF) and Greek national funds through the Operational Program "Education and Lifelong Learning" of the National Strategic Reference Framework (NSRF) — Research Funding Program: Heracleitus II. Investing in knowledge society through the European Social Fund.
- 1.Ahmed N, Tehranipoor M, Nourani M (2004) Low power pattern generation for BIST architecture. Proceedings IEEE ISCAS 2:689–692Google Scholar
- 4.Czysz D, Mrugalski G, Rajski J, Tyszer J (2007) Low power embedded deterministic test. Proceedings of the IEEE VTS, pp 75–83Google Scholar
- 5.Czysz D et al (2009) Low-power scan operation in test compression environment. IEEE Trans CAD 28:1742–1755Google Scholar
- 7.Koenemann B (1991) LFSR-coded test patterns for scan designs. Proceedings ETS/ETC., VDE Verlag, pp 237–242Google Scholar
- 8.Krishna CV, Jas A, Touba NA (2001) Test vector encoding using partial LFSR reseeding. Proceedings of IEEE Int’l Test Conf. pp 885–893Google Scholar
- 9.Lee J, Touba NA (2007) LFSR-reseeding scheme achieving low-power dissipa-tion during test. IEEE Trans CAD 26(2):396–401Google Scholar
- 11.Mrugalski G, Rajski J, Czysz D, Tyszer J (2007) New test data decompressor for low power applications. Proceedings of the ACM/IEEE Design Automation Conference. pp 539–544Google Scholar
- 13.Tenentes V, Kavousianos X (2010) Self-freeze linear decompressors for low power testing. IEEE Computer Society Annual Symposium on VLSI (ISVLSI). pp 63–68Google Scholar
- 14.Wang S, Gupta S (1999) LT-RTPG: a new test-per-scan BIST TPG for low heat dissipation. Proceedings in International Test Conference. pp 85–94Google Scholar
- 15.Wang LT et al (2005) UltraScan: Using time-division demultiplexing-multiplexing (TDDM/TDM) with VirtualScan for test cost reduction. Proceedings of the IEEE Int’l test conference. pp 946–953Google Scholar