An Infrared Thermal Measuring System for Automotive Applications and Reliability Improvement

  • S. Panarello
  • S. Patane’
  • A. Testa
  • S. De Caro
  • R. Letor
  • S. Russo
  • D. Patti
Conference paper
Part of the Lecture Notes in Electrical Engineering book series (LNEE, volume 91)

Abstract

In the last years the global energy economy hangs in the balance, pushing up the research interest in novel and renewable energy sources and in innovative engines able to improve performances saving the efficiency. This frame requires the development of power electronics subsystems and the continuous increase of working temperatures; hence reliability has become the most critical requirement for any new device design. The temporal evolution of temperature distribution on the surface of a power electronic device undergoing an exerted stress plays a fundamental role in studying and improving reliability. A suitable scanning measuring system has been realized in order to allow the analysis of fast transient states and the localization of “hot-spots” which could be a cause of a premature failure and unreliability of the devices.

Keywords

Device Under Test Thermoelectric Cooler Optical Bandwidth Power Electronic Device Integrate Circuit Technology 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Reference

  1. 1.
    Testa A, De Caro S, Panarello S, Patanè S, Letor R, Russo S, Poma S, Patti D (2008) Stress analysis and lifetime estimation on power MOSFETs for automotive ABS systems. In: 39th IEEE power electronics specialists conference (PESC 2008), pp 1169–1175, June 2008Google Scholar

Copyright information

© Springer Science+Business Media B.V. 2011

Authors and Affiliations

  • S. Panarello
    • 1
  • S. Patane’
    • 1
  • A. Testa
    • 2
  • S. De Caro
    • 2
  • R. Letor
    • 3
  • S. Russo
    • 3
  • D. Patti
    • 3
  1. 1.Dip. di Fisica della Materia e Ingegneria ElettronicaUniversity of MessinaMessinaItaly
  2. 2.Dip. di Chimica Industriale ed Ingegneria dei MaterialiUniversity of MessinaMessinaItaly
  3. 3.STMicroelectronicCataniaItaly

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