Reliability issues of NAND Flash memories

  • C. Zambelli
  • A. Chimenton
  • P. Olivo


The continuous demand for NAND flash memories with higher performance and storage capabilities pushes the manufactures towards the limits of present technologies and to explore new solutions, both from the physical and the architectural point of view.


Threshold Voltage Oxide Degradation Read Operation NAND Flash Floating Gate 
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Copyright information

© Springer Science+Business Media B.V. 2010

Authors and Affiliations

  1. 1.Dip. Ing., Università degli Studi di FerraraFerraraItaly

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