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T&H Calibration for Time-Interleaved ADCs

  • Pieter Harpe
  • Hans Hegt
  • Arthur van Roermund
Chapter
Part of the Analog Circuits and Signal Processing book series (ACSP, volume 0)

Abstract

This chapter presents a method to enhance the performance of a time-interleaved ADC, using the open-loop T&H circuit introduced in Chapter 7. 2 The approach is able to measure the mismatches between the various channels of a time-interleaved system on-chip, and to correct for these imperfections by means of analog calibration. The calibration method will be discussed, and both simulation results and experimental results will be shown. Parts of this chapter have been published previously in [77, 78].

Keywords

Input Signal Calibration Method Individual Channel Mismatch Error Gain Error 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer Science+Business Media B.V. 2010

Authors and Affiliations

  1. 1.Holst Centre – IMECEindhovenThe Netherlands
  2. 2.Department of Electrical EngineeringEindhoven University of TechnologyEindhovenThe Netherlands

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