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Near Infrared Optical Characterization Techniques for Photonic Crystals

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Abstract

In this chapter we review the different techniques used for the optical characterization of photonic crystals (PhC). The chapter is divided in three parts, the first one on optical measurement techniques based on an external light source, the second one on techniques relying on the presence of a light source inside the PhC under investigation and the third one on more advanced techniques like scanning near field optical microscopy and Fourier imaging.

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Authors and Affiliations

  1. Institut de Photonique et Electronique Quantique, Ecole Polytechnique Fédérale de Lausanne, (EPFL), Station 3, Lausanne, 1015, Switzerland

    Romuald Houdré

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  1. Romuald Houdré
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Editors and Affiliations

  1. Dipartimento di Energetica, Università di Roma „La Sapienza“, 00161, Roma, Italy

    Concita Sibilia

  2. George Green Institute for Electromagnetics Research, University of Nottingham, Nottingham, NG7 2RD, UK

    Trevor M. Benson

  3. Department of Transmission and Optical Technologies, National Institute of Telecommunications, Szachowa 1, 04-894, Warsaw, Poland

    Marian Marciniak

  4. Faculty of Physics, University of Warsaw, Pasteura 7, 02-093, Warsaw, Poland

    Tomasz Szoplik

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Houdré, R. (2008). Near Infrared Optical Characterization Techniques for Photonic Crystals. In: Sibilia, C., Benson, T.M., Marciniak, M., Szoplik, T. (eds) Photonic Crystals: Physics and Technology. Springer, Milano. https://doi.org/10.1007/978-88-470-0844-1_10

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