Skip to main content

Application of Machine Learning on Process Metrics for Defect Prediction in Mobile Application

  • Conference paper
  • First Online:
Information Systems Design and Intelligent Applications

Part of the book series: Advances in Intelligent Systems and Computing ((AISC,volume 433))

Abstract

This paper studied process metrics in detail for predicting defects in an open source mobile applications in continuation with our previous study (Moser et al. Software Engineering, 2008). Advanced modeling techniques have been applied on a vast dataset of mobile applications for proving that process metrics are better predictor of defects than code metrics for mobile applications. Mean absolute error, Correlation Coefficient and root mean squared error are determined using different machine learning techniques. In each case it was concluded that process metrics as predictors are significantly better than code metrics as predictors for bug prediction. It is shown that process metrics based defect prediction models are better for mobile applications in all regression based techniques, machine learning techniques and neuro-fuzzy modelling. Therefore separate model has been created based on only process metrics with large dataset of mobile application.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 169.00
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 219.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

References

  1. Arvinder Kaur, Kamaldeep Kaur, Harguneet Kaur “ A Comparative Study of the Accuracy of Code and Process Metrics for Defect Prediction of Mobile Applications”.

    Google Scholar 

  2. Jureczko, Marian, and Lech Madeyski. “A review of process metrics in defect prediction studies.” Metody Informatyki Stosowanej 5 (2011): 133–145.

    Google Scholar 

  3. Madeyski, Lech, and Marian Jureczko. “Which process metrics can significantly improve defect prediction models? An empirical study.” Software Quality Journal (2014): 1–30.

    Google Scholar 

  4. D’Ambros, Marco, Michele Lanza, and Romain Robbes. “An extensive comparison of bug prediction approaches.” Mining Software Repositories (MSR), 2010 7th IEEE Working Conference on. IEEE, 2010.

    Google Scholar 

  5. Jureczko, Marian, and Diomidis Spinellis. “Using object-oriented design metrics to predict software defects.” Models and Methods of System Dependability. Oficyna Wydawnicza Politechniki Wrocławskiej (2010): 69–81.

    Google Scholar 

  6. O’Keeffe, Mark, and Mel O. Cinnéide. “Search-based software maintenance.” Software Maintenance and Reengineering, 2006. CSMR 2006. Proceedings of the 10th European Conference on. IEEE, 2006: pp. 10.

    Google Scholar 

  7. Yogesh Singh, Arvinder Kaur, and Ruchika Malhotra. “Empirical validation of object-oriented metrics for predicting fault proneness models.” Software quality journal 18.1 (2010): 3–35.

    Google Scholar 

  8. Graves, T. L., Karr, A. F., Marron, J. S., Siy, H. 2000. Predicting fault incidence using software change history. IEEE Transactions on Software Engineering, 26(7): 653–661 (July 2000).

    Google Scholar 

  9. Jureczko, Marian. “Significance of different software metrics in defect prediction.” Software Engineering: An International Journal 1.1 (2011): 86–95.

    Google Scholar 

  10. Malhotra, Ruchika, Nakul Pritam, and Yogesh Singh. “On the applicability of evolutionary computation for software defect prediction.” Advances in Computing, Communications and Informatics (ICACCI, 2014 International Conference on. IEEE, 2014, 2249–2257.

    Google Scholar 

  11. Moser, Raimund, Witold Pedrycz, and Giancarlo Succi. “A comparative analysis of the efficiency of change metrics and static code attributes for defect prediction.” Software Engineering, 2008, 181–190.

    Google Scholar 

  12. Malhotra, Ruchika, and Rajeev Raje. “An empirical comparison of machine learning techniques for software defect prediction.” Proceedings of the 8th International Conference on Bioinspired Information and Communications Technologies. ICST (Institute for Computer Sciences, Social-Informatics and Telecommunications Engineering), 2014, 320–327.

    Google Scholar 

  13. Catal, Cagatay, and Banu Diri. “A systematic review of software fault prediction studies.” Expert systems with applications 36.4 (2009): 7346–7354.

    Google Scholar 

  14. Shihab, Emad, et al. “Understanding the impact of code and process metrics on post-release defects: a case study on the eclipse project.” Proceedings of the 2010 ACM-IEEE International Symposium on Empirical Software Engineering and Measurement. ACM, 2010, p. 4.

    Google Scholar 

  15. Rahman, Foyzur, and Premkumar Devanbu. “How, and why, process metrics are better.” Proceedings of the 2013 International Conference on Software Engineering. IEEE Press, 2013, pp. 432–441.

    Google Scholar 

  16. Wahyudin, Dindin, et al. “Defect Prediction using Combined Product and Project Metrics-A Case Study from the Open Source” Apache” MyFaces Project Family.” Software Engineering and Advanced Applications, 2008. SEAA’08. 34th Euromicro Conference. IEEE, 2008, pp 207–215.

    Google Scholar 

  17. Johari, Kalpana, and Arvinder Kaur. “Validation of object oriented metrics using open source software system: an empirical study.” ACM SIGSOFT Software Engineering Notes 37.1 (2012): 1–4.

    Google Scholar 

  18. S. Chidamber, and C. Kemerer, “A metrics suite for object oriented design”, IEEE Transactions on Software Engineering, vol. 20, no. 6, pp. 476-493, 1994.

    Google Scholar 

  19. ckjm—Chidamber and Kemerer Java Metrics -http://www.spinellis.gr/sw/ckjm/.

  20. https://www.openhub.net/.

Download references

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Arvinder Kaur .

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2016 Springer India

About this paper

Cite this paper

Kaur, A., Kaur, K., Kaur, H. (2016). Application of Machine Learning on Process Metrics for Defect Prediction in Mobile Application. In: Satapathy, S., Mandal, J., Udgata, S., Bhateja, V. (eds) Information Systems Design and Intelligent Applications. Advances in Intelligent Systems and Computing, vol 433. Springer, New Delhi. https://doi.org/10.1007/978-81-322-2755-7_10

Download citation

  • DOI: https://doi.org/10.1007/978-81-322-2755-7_10

  • Published:

  • Publisher Name: Springer, New Delhi

  • Print ISBN: 978-81-322-2753-3

  • Online ISBN: 978-81-322-2755-7

  • eBook Packages: EngineeringEngineering (R0)

Publish with us

Policies and ethics