Abstract
The physics of tuPOY in relation to its molecular structure forms the essence of this chapter. The manufacturing process is experimentally and theoretically justified by a variety of spectroscopical imaging, nonimaging, and micro graphical procedures. These techniques provide us with a physical insight into the conducting and radiating behavior of tuPOY. The juxtaposition of these investigations outlines the mechanism of tuPOY as the next generation processing element.
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- 1.
TEM is performed on PHILIPS CM200 microscope with a transmitted electron beam of 20 KV.
- 2.
SEM analysis is performed on Field Emission Gun-Scanning Electron Microscope (JSM-7600F) under a high vacuum of \(9.6e-5\) Pa.
- 3.
X-ray diffraction patterns were measured using a Philips PW1050 X-ray diffractometer.
- 4.
Phillips X’Pert software package is used to calculate the sample composition from X-ray diffraction data.
- 5.
The tuPOY material is characterized by \(^{1}H\)-NMR recorded on a 300 MHz VARIAN mercury spectrometer, taken on a sample dissolved in acetone.
- 6.
Molecular fingerprinting of tuPOY is performed using NICOLET IR200 FTIR system where infrared beam is made to fall on the material.
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Mustafa, H.D., Karamchandani, S.H., Merchant, S.N., Desai, U.B. (2016). Thermal Unstability Analysis. In: tuPOY: Thermally Unstable Partially Oriented Yarns. Advanced Structured Materials, vol 23. Springer, New Delhi. https://doi.org/10.1007/978-81-322-2632-1_3
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DOI: https://doi.org/10.1007/978-81-322-2632-1_3
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Online ISBN: 978-81-322-2632-1
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