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1-Error Linear Complexity Test for Binary Sequences

  • Hetal G. Borisagar
  • Prasanna R. Mishra
  • Navneet Gaba
Conference paper
Part of the Advances in Intelligent Systems and Computing book series (AISC, volume 259)

Abstract

This paper presents 1-Error Linear Complexity Test (1-ELCT) which is based on Linear Complexity Test—LCT described in (Rukhin et al., NIST Special Publication 800–822, 2001). 1-ELCT is improved version of Bit Flipping Linear Complexity Test (BFLCT). In BFLCT, it is checked that wether the sequence remains random or not after flipping one bit with respect to the LCT. 1-ELCT is for block length of the form \( M = 2^{q} ,\;q \in {\mathbb{N}}\,\& \;q > 8 \) and it is of practical use for binary sequences of length 106.

Keywords

Linear complexity k-error linear complexity Linear complexity test 

Notes

Acknowledgments

We would like to thank Dr. P. K. Saxena, Dr. S. S. Bedi and Ms. Neelam Verma for their support. Also we are thankful to Dr. Indivar Gupta for his valuable suggestions.

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Copyright information

© Springer India 2014

Authors and Affiliations

  • Hetal G. Borisagar
    • 1
  • Prasanna R. Mishra
    • 2
  • Navneet Gaba
    • 3
  1. 1.DRDODelhiIndia
  2. 2.SAGDelhiIndia
  3. 3.DRDO Ministry of DefenceNew DelhiIndia

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