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Plasmid Loss Probability in Escherichia coli as a Function of the Growth Rate of Plasmid-Bearing Cells. I: Variation During Continuous Cultures

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Biochemical Engineering for 2001

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Abstract

The stability of plasmids or other recombinant DNA vectors is one of the main factors in large-scale production using genetically engineered cells. This is mainly due to genetic instabilities due to mutation or to failure to transmit the recombinant DNA to progeny cells [1,2]. So in order to optimize both construction of the host-vector production organism and design the best possible bioreactor operating environment, the influences of both genetic and environmental parameters on genetic instability and growth of recombinant cells must be understood.

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Author information

Authors and Affiliations

  1. CNRS-ENSAIA, BP 3, 2, Avenue de la Forêt de Haye, 54501, Vandoeuvre-les-Nancy, France

    Nabil Nancib, Ridha Mosrati & Joseph Boudrant

Authors
  1. Nabil Nancib
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  2. Ridha Mosrati
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  3. Joseph Boudrant
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Editor information

Editors and Affiliations

  1. Department of Chemical Engineering, Faculty of Engineering, The University of Tokyo, 3-1 Hongo 7-chome, Bunkyo-ku, Tokyo 113, Japan

    Shintaro Furusaki

  2. The Institute of Physical and Chemical Research, 2-1 Hirosawa, Wako-shi, Saitama, 351-01, Japan

    Isao Endo (Head of Chemical Engineering Laboratory) (Head of Chemical Engineering Laboratory)

  3. Department of Food Science and Technology, Faculty of Agriculture, Kyoto University, Kitashirakawa Oiwake-cho, Sakyo-ku, Kyoto, 606-01, Japan

    Ryuichi Matsuno

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© 1992 Springer-Verlag Tokyo

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Nancib, N., Mosrati, R., Boudrant, J. (1992). Plasmid Loss Probability in Escherichia coli as a Function of the Growth Rate of Plasmid-Bearing Cells. I: Variation During Continuous Cultures. In: Furusaki, S., Endo, I., Matsuno, R. (eds) Biochemical Engineering for 2001. Springer, Tokyo. https://doi.org/10.1007/978-4-431-68180-9_10

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  • DOI: https://doi.org/10.1007/978-4-431-68180-9_10

  • Publisher Name: Springer, Tokyo

  • Print ISBN: 978-4-431-68182-3

  • Online ISBN: 978-4-431-68180-9

  • eBook Packages: Springer Book Archive

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