Abstract
Before going into a detailed explanation of the hardware of transmission electron microscopes and analytical methods, it is necessary to understand some fundamental aspects. These areas include the interactions between incident electrons and materials, the basic principles of analytical electron microscopy, and the processing of analytical data.
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Shindo, D., Oikawa, T. (2002). Basic Principles of Analytical Electron Microscopy. In: Analytical Electron Microscopy for Materials Science. Springer, Tokyo. https://doi.org/10.1007/978-4-431-66988-3_1
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DOI: https://doi.org/10.1007/978-4-431-66988-3_1
Publisher Name: Springer, Tokyo
Print ISBN: 978-4-431-70336-5
Online ISBN: 978-4-431-66988-3
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