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Electron Nano-Imaging pp 305–307Cite as

Debye–Waller Factor and Thermal Diffuse Scattering (TDS)

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Abstract

In this book, we study the effects of inelastically scattered electrons to TEM images qualitatively, as described in Sect. 7.1.8. The effects are, to some extent, related also to Stobbs’s problem for discrepancy between experiments and simulations. (Boothroyd 1998).

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Notes

  1. 1.

    See Zachariasen (1967) and Wang (1995).

  2. 2.

    The Debeye–Waller parameter is sometimes defined by formula \( M = 0.5 \langle \left( {\Delta r} \right)^{2} \rangle \) without the \( (\sin \theta /\lambda )^{2} \) term.

  3. 3.

    See Yoshioka (1957).

  4. 4.

    See Hall and Hirsch (1965).

References

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  • Kohl, H., & Rose, H. (1985). Advance in electronic and electron physics. Amsterdam: Academic Press.

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  • Van Hove, (1954). Physical Review Letters, 95, 249.

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  • Wang, Z. L. (1995). Elastic and inelastic scattering in electron diffraction and imaging. New York: Plenum Press.

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  • Yoshioka, H. (1957). Journal of the Physical Society of Japan, 12, 618.

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  • Zachariazen, W. H. (1967). Theory of X-ray diffraction in crystals. New York: Dover.

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Authors and Affiliations

  1. Nagoya University, Nagoya, Japan

    Nobuo Tanaka

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  1. Nobuo Tanaka
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Correspondence to Nobuo Tanaka .

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Tanaka, N. (2017). Debye–Waller Factor and Thermal Diffuse Scattering (TDS). In: Electron Nano-Imaging. Springer, Tokyo. https://doi.org/10.1007/978-4-431-56502-4_30

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