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Advanced Analysis of Surface Films Formed on Passive Metals and Alloys Using X-ray Photoelectron Spectroscopy

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Progress in Advanced Structural and Functional Materials Design
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Abstract

Most of high corrosion resistance advanced structural and functional metals and alloys are protected by passive films, that is oxide and/or hydroxide films of few nm in thickness. In this chapter, properties of oxide/hydroxide film formed on metals and alloys are briefly summarized, then the procedure of quantitative analysis of passive film using X-ray photoelectron spectroscopy is described in detail as a one of characterization technique. Passive films on Cr containing high corrosion alloys, such as stainless steels, high nickel alloys, Co–Cr alloys, consist of highly Cr enriched oxide layer and covering hydroxide layer. Assuming the duplex model, the thickness and the content including chemical states in both layers, are quantitatively estimated from deconvoluted XPS spectra acquired without any sputtering technique.

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References

  1. Szklarska-Smialovska Z, Kozowski Z (1983) In: Froment M (ed) Passivity of metals and semiconductors. Elsevier, Amsterdam, p 89

    Google Scholar 

  2. Ohtsuka T (1992) Denkikagaku 60:1123

    CAS  Google Scholar 

  3. Kirchheim R (1994) In: Marcus P, Baroux B, Keddam M (eds) The institute of metals., p 102

    Google Scholar 

  4. Boucherit N, Hugot-Le Goff A, Joiret S (1989) Thin Solid Films 174:111

    Article  CAS  Google Scholar 

  5. Gui J, Devine TM (1994) Corros Sci 36:441

    Article  CAS  Google Scholar 

  6. Azumi K, Ohtsuka T, Sato N (1987) J Electrochem Soc 134:1352

    Article  CAS  Google Scholar 

  7. Hara N, Sugimoto K (1991) J Electrochem Soc 138:1594

    Article  CAS  Google Scholar 

  8. Hara N, Sugimoto K (1990) Corros Sci 31(197)

    Google Scholar 

  9. Tsuchiya H, Fujimoto S, Shibata T (2004) J Electrochem Soc 151:B39

    Article  CAS  Google Scholar 

  10. Fujimoto S (2005) In: Waseda Y, Suzuki S (eds) Characterization of corrosion products on steel surfaces. Springer, Benlin, p 33

    Google Scholar 

  11. Lumsden JB, Staehle RW (1972) Scr Metall 6:1205

    Article  CAS  Google Scholar 

  12. Seo M, Saito R, Sato N (1980) J Electrochem Soc 127:1909

    Article  CAS  Google Scholar 

  13. Asami K, Hashimoto K, Shimodaira S (1977) Corros Sci 17(713)

    Google Scholar 

  14. Marcus P, Olefjord I (1982) Surf Interface Anal 4:29

    Article  CAS  Google Scholar 

  15. Asami K, Ohnuma S, Masumoto T (1998) Surf Interface Anal 26:659

    Article  CAS  Google Scholar 

  16. Suzuki S (2005) In: Waseda Y, Suzuki S (eds) Characterization of corrosion products on steel surfaces. Springer, Benlin, p 131

    Google Scholar 

  17. Asami K (2005) In: Waseda Y, Suzuki S (eds) Characterization of corrosion products on steel surfaces. Springer, p 159

    Google Scholar 

  18. Despic A, Parkhutik V (1989) Modern aspects of electrochemistry, vol 20. Plenum, New York, p 401

    Google Scholar 

  19. Habazaki H, Shimizu K, Skeldon P, Thompson GE, Wood GC (1998) J Surf Sci Soc Jpn 19:772

    Article  CAS  Google Scholar 

  20. Marcus P, Maurice V (eds) (2006) Passivity of metals and semiconductors, and properties of thin oxide layers. Elsevier, Amsterdam

    Google Scholar 

  21. Ohtsuka T (1995) Mater Jpn 34:1037

    Article  CAS  Google Scholar 

  22. Fujimoto S, Shibata T (1998) J Surf Sci Soc Jpn 19:812

    Article  CAS  Google Scholar 

  23. Azumi K, Ohtsuka T, Sato N (1983) In: Froment M (ed) Passivity of metals and semiconductor. Elsevier, Amsterdam, p 199

    Google Scholar 

  24. Chao CY, Szklarska-Smialowska Z (1980) Surf Sci 96:426

    Article  CAS  Google Scholar 

  25. Hoppe HW, Strehblow HH (1990) Corros Sci 31:167

    Article  CAS  Google Scholar 

  26. Ohtsuka T, Sato N (1983) J Electroanal Chem 147:167

    Article  CAS  Google Scholar 

  27. Asami K, Hashimoto K, Shimodaira S (1978) Corros Sci 18:151

    Article  CAS  Google Scholar 

  28. Asami K, Hashimoto K (1979) Corros Sci 19:427

    Article  Google Scholar 

  29. Kawashima A, Asami K, Hashimoto K (1985) Corros Sci 25:1103

    Article  CAS  Google Scholar 

  30. McIntyre MS, Zetaruk DG, Owen D (1979) J Electrochem Soc 126:750

    Article  CAS  Google Scholar 

  31. Hanawa T, Hiromoto S, Asami K (2001) Appl Surf Sci 183:68

    Article  CAS  Google Scholar 

  32. Milosev I, Strehblow HH (2003) Electrochim Acta 48:2767

    Article  CAS  Google Scholar 

  33. Olefjord I, Wegrelius L (1990) Corros Sci 31:89

    Article  CAS  Google Scholar 

  34. Yang WP, Costa D, Marcus P (1994) J Electrochem Soc 141:2669

    Article  CAS  Google Scholar 

  35. Scofield JH (1976) J Electron Spectros Relat Phenom 8:129

    Article  CAS  Google Scholar 

  36. Asami K, Hashimoto K, Shimodaira S (1977) Corros Sci 17:713

    Article  CAS  Google Scholar 

  37. Asami K, Hashimoto K (1984) Corros Sci 84:83

    Article  Google Scholar 

  38. Hashimoto K, Asami K (1977) Boshoku Gijyutsu 26:375

    CAS  Google Scholar 

  39. Wagner CD, Davis LE, Zeller MV, Taylor JA, Raymound RH, Gale LH (1981) Surf Interface Anal 3:211

    Article  CAS  Google Scholar 

  40. Tanuma S, Powell CJ, Penn DR (1988) Surf lnferface Anal 11:577

    Article  CAS  Google Scholar 

  41. Tanuma S, Powell CJ, Penn DR (1991) Surf lnferface Anal 17:911

    Article  CAS  Google Scholar 

  42. Tanuma S, Powell CJ, Penn DR (1991) Surf lnferface Anal 17:927

    Article  CAS  Google Scholar 

  43. Tanuma S, Powell CJ, Penn DR (1993) Surf lnferface Anal 20:77

    Article  CAS  Google Scholar 

  44. Tanuma S, Powell CJ, Penn DR (1993) Surf Interface Anal 21:165

    Article  Google Scholar 

  45. Gries WG (1996) Surf Interface Anal 24:38

    Article  CAS  Google Scholar 

  46. Olefjord I (1991) In: Proceedings of the symposium on the application of surface analytical methods to environmental/material interactions, PV 91–7, The Electrochemical Society, p 22

    Google Scholar 

  47. Marcus P, Olefjord I (1988) Corros Sci 28:589

    Article  CAS  Google Scholar 

  48. De Vito E, Marcus P (1992) Surf lnferface Anal 19:403

    Article  Google Scholar 

  49. Yang WP, Costa D, Marcus P (1994) J Electrochem Soc 141:111

    Article  CAS  Google Scholar 

  50. Maurice V, Yang WP, Marcus P (1998) J Electrochem Soc 145:909

    Article  CAS  Google Scholar 

  51. Tossi A, Elsener B (1995) Mater Sci Forum 185/188:337

    Article  Google Scholar 

  52. Fujimoto S, Yamada T, Shibata T (1998) J Electrochem Soc 145:L79

    Article  CAS  Google Scholar 

  53. Fujimoto S, Shibata T, Yamada T (1998) J Jpn Soc Mater 62:527

    CAS  Google Scholar 

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Correspondence to Shinji Fujimoto .

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Fujimoto, S. (2013). Advanced Analysis of Surface Films Formed on Passive Metals and Alloys Using X-ray Photoelectron Spectroscopy. In: Kakeshita, T. (eds) Progress in Advanced Structural and Functional Materials Design. Springer, Tokyo. https://doi.org/10.1007/978-4-431-54064-9_6

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