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Element Profiling by Secondary Ion Mass Spectrometry of Surface Layers in Glasses

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Progress in Materials Analysis

Part of the book series: Mikrochimica Acta Supplementum ((MIKROCHIMICA,volume 11))

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Abstract

In the nuclear energy program of several countries, re-processed reactor waste is to be dissolved in glass for subsequent storage in geological burial sites (see e.g. 1). Waste form glasses must meet the demands of low viscosity liquid processing at relatively low temperatures; consideration has therefore mainly been given to alkali borosilicate (ABS) glasses. The waste containing processed glass is to satisfy the requirement of high corrosion resistance (low leachability) in interaction with water and with various components of the storage system.

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© 1985 Springer-Verlag

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Lodding, A., Odelius, H., Clark, D.E., Werme, L.O. (1985). Element Profiling by Secondary Ion Mass Spectrometry of Surface Layers in Glasses. In: Grasserbauer, M., Wegscheider, W. (eds) Progress in Materials Analysis. Mikrochimica Acta Supplementum, vol 11. Springer, Vienna. https://doi.org/10.1007/978-3-7091-8840-8_12

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  • DOI: https://doi.org/10.1007/978-3-7091-8840-8_12

  • Publisher Name: Springer, Vienna

  • Print ISBN: 978-3-211-81905-0

  • Online ISBN: 978-3-7091-8840-8

  • eBook Packages: Springer Book Archive

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