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A New Correction Method for the Fluorescence Effect in Quantitative Microprobe Analysis

  • Conference paper

Part of the book series: Mikrochimica Acta ((MIKROCHIMICA,volume 6))

Abstract

A main problem in quantitative microprobe analysis is the conversion of measured X-ray intensities into the concentration values of the corresponding elements in the specimen.

Herrn Prof. Dr. Walter Koch zum 65. Geburtstag gewidmet und anläßlich des 7. Kolloquiums über metallkundliche Analyse mit besonderer Berücksichtigung der Elektronenstrahlmikroanalyse, Wien, 23.–25. 10. 1974 vorgetragen.

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References

  1. R. Castaing, Thesis, University of Paris, 1951.

    Google Scholar 

  2. R. Castaing and J. Descamp, J. Phys. Rad. 16, 304 (1955).

    Article  Google Scholar 

  3. G. Shinoda, Optique des Rayons X et Microanalyse, Paris: Hermann. 1966. p. 97.

    Google Scholar 

  4. A. Vignes and G. Dez, Brit. J. Appl. Phys., Ser. 2, 1, 1309 (1968).

    Google Scholar 

  5. M. Green, Proc. Phys. Soc. 82, 204 (1963).

    Article  ADS  Google Scholar 

  6. H. E. Bishop, Proc. Phys. Soc. 85, 855 (1965).

    Article  ADS  Google Scholar 

  7. J. Philibert, Meteaux Corrosion Industries (1964), Nr. 465, p. 157, Nr. 466, p. 216, Nr. 469, p. 325.

    Google Scholar 

  8. P. Duncumb and P. K. Shields, The Electron Microprobe, New York: Wiley. 1966. p. 284.

    Google Scholar 

  9. C. H. Thoma and P. Willer, Vth Int. Congress on X-Ray-Optics and Microanalysis, Berlin: Springer-Verlag. 1969. p. 160.

    Google Scholar 

  10. C. H. Thoma, Mikrochim. Acta [Wien], Suppl. IV, 1970, 102.

    Google Scholar 

  11. U. Schmitz, P. L. Ryder, and W. Pitsch, Vth Int. Congress on X-RayOptics and Microanalysis, Berlin: Springer-Verlag. 1969. p. 104.

    Google Scholar 

  12. A. R. Büchner and W. Pitsch, Z. Metallkunde 62, 392 (1971).

    Google Scholar 

  13. A. R. Büchner and W. Pitsch, Z. Metallkunde 63, 398 (1972).

    Google Scholar 

  14. A. Kohlhaas and F. Scheiding, Arch. Eisenhüttenwes. 43, 241 (1972).

    Google Scholar 

  15. A. R. Büchner, Z. Metallkunde 65, 375 (1974).

    Google Scholar 

  16. S. Gadea and M. Petrescu, Studii si Cercetari de Metalurgie, Tom 18, Nr. 2, 163, 1973, Ed. Acad. R. S. R.

    Google Scholar 

  17. E. W. White et al., X-Ray Wavelength and Crystal Interchange Settings for Wavelength Geared Curved Crystal Spectrometers, Metals Research Lab., 1964, Pennsylvania State University.

    Google Scholar 

  18. S. B. J. Reed, Brit. J. Appl. Phys. 16, 913 (1965).

    Article  ADS  Google Scholar 

  19. A. R. Büchner, Quantitative Analysis with Electron Microprobes and Secondary Ion Mass Spectrometry, Jül-Conf-8 (1973), Edited by E. Preuss, p. 26.

    Google Scholar 

  20. K. F. J. Heinrich, The Electron Microprobe, New York: Wiley. 1966. p. 296.

    Google Scholar 

  21. A. R. Büchner, Arch. Eisenhüttenwes. 44, 143 (1973).

    Google Scholar 

  22. A. Ralston and H. S. Wilf, Mathematical Methods for Digital Computers, Vol. 2, New York: Wiley. 1967.

    MATH  Google Scholar 

  23. K. F. J. Heinrich and H. Yakowitz, Mikrochim. Acta [Wien] 1968, 905.

    Google Scholar 

  24. M. Green and V. E. Cosslett, Brit. J. Appl. Phys., Ser. 2, 1, 425 (1968).

    Google Scholar 

  25. W. Bambyneck et al., Rev. Mod. Phys. 44, 716 (1972).

    Article  ADS  Google Scholar 

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© 1975 Springer-Verlag Wien

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Büchner, A.R., Stienen, J.P.M. (1975). A New Correction Method for the Fluorescence Effect in Quantitative Microprobe Analysis. In: Zacherl, M.K. (eds) Siebentes Kolloquium über metallkundliche Analyse mit besonderer Berücksichtigung der Elektronenstrahl-Mikroanalyse. Mikrochimica Acta, vol 6. Springer, Vienna. https://doi.org/10.1007/978-3-7091-8422-6_18

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  • DOI: https://doi.org/10.1007/978-3-7091-8422-6_18

  • Publisher Name: Springer, Vienna

  • Print ISBN: 978-3-211-81328-7

  • Online ISBN: 978-3-7091-8422-6

  • eBook Packages: Springer Book Archive

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