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Efficiency Calibration of a Si(Li) Detector by EPMA

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Modern Developments and Applications in Microbeam Analysis

Part of the book series: Mikrochimica Acta Supplement ((MIKROCHIMICA,volume 15))

Abstract

A φ(ρz)-model, well known for its high accuracy, is employed for determining the detection efficiency of a Si(Li) detector by EPMA. Problems and advantages of this approach are pointed out and possible errors in the resulting thicknesses of the beryllium window, the silicon dead layer, the gold contact layer and the ice build-up on the detector surface are estimated. Furthermore the method allows the calculation of the cross section for L 3 subshell ionization to be made with high reliability.

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Author information

Authors and Affiliations

  1. Institute of Applied and Technical Physics, Technical University of Vienna, Wiedner Hauptstrasse 8-10, A-1040, Wien, Austria

    Kurt Röhrbacher, Michael Andrae, Martin Völkerer & Johann Wernisch

Authors
  1. Kurt Röhrbacher
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  2. Michael Andrae
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  3. Martin Völkerer
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  4. Johann Wernisch
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Editor information

Editors and Affiliations

  1. Centre for Electron Optical Studies, University of Bath, UK

    Glyn Love

  2. Department of Physics and Astronomy, University of Glasgow, UK

    W. A. Patrick Nicholson

  3. Istituto LAMEL, C.N.R., Bologna, Italy

    Aldo Armigliato

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© 1998 Springer-Verlag Wien

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Röhrbacher, K., Andrae, M., Völkerer, M., Wernisch, J. (1998). Efficiency Calibration of a Si(Li) Detector by EPMA. In: Love, G., Nicholson, W.A.P., Armigliato, A. (eds) Modern Developments and Applications in Microbeam Analysis. Mikrochimica Acta Supplement, vol 15. Springer, Vienna. https://doi.org/10.1007/978-3-7091-7506-4_3

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  • DOI: https://doi.org/10.1007/978-3-7091-7506-4_3

  • Publisher Name: Springer, Vienna

  • Print ISBN: 978-3-211-83106-9

  • Online ISBN: 978-3-7091-7506-4

  • eBook Packages: Springer Book Archive

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