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Digging for Light in Semiconductor Mines — Infrared Views of Luminescent Porous Silicon

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Progress in Fourier Transform Spectroscopy

Part of the book series: Mikrochimica Acta Supplement ((MIKROCHIMICA,volume 14))

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Abstract

Infrared reflection spectroscopy is presented as a tool for the investigation of porous silicon. The simulation approach used for spectrum interpretation is discussed. The porous silicon aging behaviour, a relation between silicon-hydrogen vibrational modes and luminescence as well as the structuring of porous silicon required for devices are discussed.

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Author information

Authors and Affiliations

  1. I. Physikalisches Institut, Aachen University of Technology (RWTH), D-52056, Aachen, Federal Republic of Germany

    Wolfgang Theiß

Authors
  1. Wolfgang Theiß
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Editor information

Editors and Affiliations

  1. Department of Analytical Chemistry, University of Veszprém, Veszprém, Hungary

    János Mink

  2. Institute of Isotopes, Hungarian Academy of Sciences, Budapest, Hungary

    János Mink

  3. Central Research Institute of Chemistry, Hungarian Academy of Sciences, Budapest, Hungary

    Gábor Keresztury

  4. Institut für Analytische Chemie, Technische Universität Wien, Wien, Austria

    Robert Kellner

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© 1997 Springer-Verlag Wien

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Theiß, W. (1997). Digging for Light in Semiconductor Mines — Infrared Views of Luminescent Porous Silicon. In: Mink, J., Keresztury, G., Kellner, R. (eds) Progress in Fourier Transform Spectroscopy. Mikrochimica Acta Supplement, vol 14. Springer, Vienna. https://doi.org/10.1007/978-3-7091-6840-0_4

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  • DOI: https://doi.org/10.1007/978-3-7091-6840-0_4

  • Publisher Name: Springer, Vienna

  • Print ISBN: 978-3-211-82931-8

  • Online ISBN: 978-3-7091-6840-0

  • eBook Packages: Springer Book Archive

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